| Original language | English |
|---|---|
| Pages (from-to) | 686-687 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| Publication status | Published - Aug 2008 |
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Nanostructures
Imaging techniques
Scanning electron microscopy
scanning electron microscopy
ASJC Scopus subject areas
- Instrumentation
Cite this
Muto, A., Buchholz, D. B., Chang, R. P. H., & Dravid, V. P. (2008). Multimodal imaging of nanostructures with FEG SEM. Microscopy and Microanalysis, 14(SUPPL. 2), 686-687. https://doi.org/10.1017/S1431927608084602
Multimodal imaging of nanostructures with FEG SEM. / Muto, A.; Buchholz, D. B.; Chang, Robert P. H.; Dravid, V. P.
In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 08.2008, p. 686-687.Research output: Contribution to journal › Article
Muto, A, Buchholz, DB, Chang, RPH & Dravid, VP 2008, 'Multimodal imaging of nanostructures with FEG SEM', Microscopy and Microanalysis, vol. 14, no. SUPPL. 2, pp. 686-687. https://doi.org/10.1017/S1431927608084602
Muto A, Buchholz DB, Chang RPH, Dravid VP. Multimodal imaging of nanostructures with FEG SEM. Microscopy and Microanalysis. 2008 Aug;14(SUPPL. 2):686-687. https://doi.org/10.1017/S1431927608084602
@article{c82289f4c4f34a61ba58e73c5410870f,
title = "Multimodal imaging of nanostructures with FEG SEM",
author = "A. Muto and Buchholz, {D. B.} and Chang, {Robert P. H.} and Dravid, {V. P.}",
year = "2008",
month = "8",
doi = "10.1017/S1431927608084602",
language = "English",
volume = "14",
pages = "686--687",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",
}
TY - JOUR
T1 - Multimodal imaging of nanostructures with FEG SEM
AU - Muto, A.
AU - Buchholz, D. B.
AU - Chang, Robert P. H.
AU - Dravid, V. P.
PY - 2008/8
Y1 - 2008/8
UR - http://www.scopus.com/inward/record.url?scp=49549089525&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49549089525&partnerID=8YFLogxK
U2 - 10.1017/S1431927608084602
DO - 10.1017/S1431927608084602
M3 - Article
VL - 14
SP - 686
EP - 687
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - SUPPL. 2
ER -