Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes

Jingjing Jiang, Zhuangqun Huang, Chengxiang Xiang, Rakesh Poddar, Hans Joachim Lewerenz, Kimberly M. Papadantonakis, Nathan S Lewis, Bruce S. Brunschwig

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The interfacial properties of electrolessly deposited Pt nanoparticles (Pt-NPs) on p-Si and p+-Si electrodes were investigated on the nanometer scale using a combination of scanning probe methods. Atomic force microscopy (AFM) showed highly dispersed Pt-NPs with diameters of 20–150 nm on the Si surface. Conductive AFM measurements showed that only approximately half of the particles exhibited measurable contact currents, with a factor of 103 difference in current observed between particles at a given bias. Local current–voltage measurements revealed a rectifying junction with a resistance ≥10 MΩ at the Pt-NP/p-Si interface, whereas the Pt-NP/p+-Si samples formed an ohmic junction with a local resistance ≥1 MΩ. The particles were strongly attached to the sample surface in air. However, in an electrolyte, the adhesion of the particles to the surface was substantially lower, and most of the particles had tip-contact currents that varied by a factor of approximately 10. Scanning electrochemical microscopy (SECM) showed smaller but more uniform electrochemical currents for the particles relative to the currents observed by conductive AFM. In accord with the conductive AFM measurements, the SECM measurements showed conductance through the substrate for only a minority of the particles. These results suggest that the electrochemical performance of the electrolessly deposited Pt nanoparticles on Si can be ascribed to: 1) The high resistance of the contact between the particles and the substrate, 2) the low (<50 %) fraction of particles that support high currents, and 3) the low adhesion of the particles to the surface when in contact with the electrolyte.

Original languageEnglish
Pages (from-to)4657-4663
Number of pages7
JournalChemSusChem
Volume10
Issue number22
DOIs
Publication statusPublished - Nov 23 2017

Fingerprint

Atomic force microscopy
electrode
Imaging techniques
Electrodes
Nanoparticles
Scanning
atomic force microscopy
Electrolytes
Microscopic examination
Adhesion
Substrates
adhesion
electrolyte
microscopy
particle
substrate
Air
probe
air
nanoparticle

Keywords

  • afm
  • electrochemistry
  • energy conversion
  • interface
  • secm

ASJC Scopus subject areas

  • Environmental Chemistry
  • Chemical Engineering(all)
  • Materials Science(all)
  • Energy(all)

Cite this

Jiang, J., Huang, Z., Xiang, C., Poddar, R., Lewerenz, H. J., Papadantonakis, K. M., ... Brunschwig, B. S. (2017). Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes. ChemSusChem, 10(22), 4657-4663. https://doi.org/10.1002/cssc.201700893

Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes. / Jiang, Jingjing; Huang, Zhuangqun; Xiang, Chengxiang; Poddar, Rakesh; Lewerenz, Hans Joachim; Papadantonakis, Kimberly M.; Lewis, Nathan S; Brunschwig, Bruce S.

In: ChemSusChem, Vol. 10, No. 22, 23.11.2017, p. 4657-4663.

Research output: Contribution to journalArticle

Jiang, J, Huang, Z, Xiang, C, Poddar, R, Lewerenz, HJ, Papadantonakis, KM, Lewis, NS & Brunschwig, BS 2017, 'Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes', ChemSusChem, vol. 10, no. 22, pp. 4657-4663. https://doi.org/10.1002/cssc.201700893
Jiang J, Huang Z, Xiang C, Poddar R, Lewerenz HJ, Papadantonakis KM et al. Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes. ChemSusChem. 2017 Nov 23;10(22):4657-4663. https://doi.org/10.1002/cssc.201700893
Jiang, Jingjing ; Huang, Zhuangqun ; Xiang, Chengxiang ; Poddar, Rakesh ; Lewerenz, Hans Joachim ; Papadantonakis, Kimberly M. ; Lewis, Nathan S ; Brunschwig, Bruce S. / Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes. In: ChemSusChem. 2017 ; Vol. 10, No. 22. pp. 4657-4663.
@article{9b422b33ca3a40a8a0391239b3ccf6b9,
title = "Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes",
abstract = "The interfacial properties of electrolessly deposited Pt nanoparticles (Pt-NPs) on p-Si and p+-Si electrodes were investigated on the nanometer scale using a combination of scanning probe methods. Atomic force microscopy (AFM) showed highly dispersed Pt-NPs with diameters of 20–150 nm on the Si surface. Conductive AFM measurements showed that only approximately half of the particles exhibited measurable contact currents, with a factor of 103 difference in current observed between particles at a given bias. Local current–voltage measurements revealed a rectifying junction with a resistance ≥10 MΩ at the Pt-NP/p-Si interface, whereas the Pt-NP/p+-Si samples formed an ohmic junction with a local resistance ≥1 MΩ. The particles were strongly attached to the sample surface in air. However, in an electrolyte, the adhesion of the particles to the surface was substantially lower, and most of the particles had tip-contact currents that varied by a factor of approximately 10. Scanning electrochemical microscopy (SECM) showed smaller but more uniform electrochemical currents for the particles relative to the currents observed by conductive AFM. In accord with the conductive AFM measurements, the SECM measurements showed conductance through the substrate for only a minority of the particles. These results suggest that the electrochemical performance of the electrolessly deposited Pt nanoparticles on Si can be ascribed to: 1) The high resistance of the contact between the particles and the substrate, 2) the low (<50 {\%}) fraction of particles that support high currents, and 3) the low adhesion of the particles to the surface when in contact with the electrolyte.",
keywords = "afm, electrochemistry, energy conversion, interface, secm",
author = "Jingjing Jiang and Zhuangqun Huang and Chengxiang Xiang and Rakesh Poddar and Lewerenz, {Hans Joachim} and Papadantonakis, {Kimberly M.} and Lewis, {Nathan S} and Brunschwig, {Bruce S.}",
year = "2017",
month = "11",
day = "23",
doi = "10.1002/cssc.201700893",
language = "English",
volume = "10",
pages = "4657--4663",
journal = "ChemSusChem",
issn = "1864-5631",
publisher = "Wiley-VCH Verlag",
number = "22",

}

TY - JOUR

T1 - Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes

AU - Jiang, Jingjing

AU - Huang, Zhuangqun

AU - Xiang, Chengxiang

AU - Poddar, Rakesh

AU - Lewerenz, Hans Joachim

AU - Papadantonakis, Kimberly M.

AU - Lewis, Nathan S

AU - Brunschwig, Bruce S.

PY - 2017/11/23

Y1 - 2017/11/23

N2 - The interfacial properties of electrolessly deposited Pt nanoparticles (Pt-NPs) on p-Si and p+-Si electrodes were investigated on the nanometer scale using a combination of scanning probe methods. Atomic force microscopy (AFM) showed highly dispersed Pt-NPs with diameters of 20–150 nm on the Si surface. Conductive AFM measurements showed that only approximately half of the particles exhibited measurable contact currents, with a factor of 103 difference in current observed between particles at a given bias. Local current–voltage measurements revealed a rectifying junction with a resistance ≥10 MΩ at the Pt-NP/p-Si interface, whereas the Pt-NP/p+-Si samples formed an ohmic junction with a local resistance ≥1 MΩ. The particles were strongly attached to the sample surface in air. However, in an electrolyte, the adhesion of the particles to the surface was substantially lower, and most of the particles had tip-contact currents that varied by a factor of approximately 10. Scanning electrochemical microscopy (SECM) showed smaller but more uniform electrochemical currents for the particles relative to the currents observed by conductive AFM. In accord with the conductive AFM measurements, the SECM measurements showed conductance through the substrate for only a minority of the particles. These results suggest that the electrochemical performance of the electrolessly deposited Pt nanoparticles on Si can be ascribed to: 1) The high resistance of the contact between the particles and the substrate, 2) the low (<50 %) fraction of particles that support high currents, and 3) the low adhesion of the particles to the surface when in contact with the electrolyte.

AB - The interfacial properties of electrolessly deposited Pt nanoparticles (Pt-NPs) on p-Si and p+-Si electrodes were investigated on the nanometer scale using a combination of scanning probe methods. Atomic force microscopy (AFM) showed highly dispersed Pt-NPs with diameters of 20–150 nm on the Si surface. Conductive AFM measurements showed that only approximately half of the particles exhibited measurable contact currents, with a factor of 103 difference in current observed between particles at a given bias. Local current–voltage measurements revealed a rectifying junction with a resistance ≥10 MΩ at the Pt-NP/p-Si interface, whereas the Pt-NP/p+-Si samples formed an ohmic junction with a local resistance ≥1 MΩ. The particles were strongly attached to the sample surface in air. However, in an electrolyte, the adhesion of the particles to the surface was substantially lower, and most of the particles had tip-contact currents that varied by a factor of approximately 10. Scanning electrochemical microscopy (SECM) showed smaller but more uniform electrochemical currents for the particles relative to the currents observed by conductive AFM. In accord with the conductive AFM measurements, the SECM measurements showed conductance through the substrate for only a minority of the particles. These results suggest that the electrochemical performance of the electrolessly deposited Pt nanoparticles on Si can be ascribed to: 1) The high resistance of the contact between the particles and the substrate, 2) the low (<50 %) fraction of particles that support high currents, and 3) the low adhesion of the particles to the surface when in contact with the electrolyte.

KW - afm

KW - electrochemistry

KW - energy conversion

KW - interface

KW - secm

UR - http://www.scopus.com/inward/record.url?scp=85034983072&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85034983072&partnerID=8YFLogxK

U2 - 10.1002/cssc.201700893

DO - 10.1002/cssc.201700893

M3 - Article

VL - 10

SP - 4657

EP - 4663

JO - ChemSusChem

JF - ChemSusChem

SN - 1864-5631

IS - 22

ER -