Nanoscale β-nuclear magnetic resonance depth imaging of topological insulators

Dimitrios Koumoulis, Gerald D. Morris, Liang He, Xufeng Kou, Danny King, Dong Wang, Masrur D. Hossain, Kang L. Wang, Gregory A. Fiete, Mercouri G Kanatzidis, Louis S. Bouchard

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Considerable evidence suggests that variations in the properties of topological insulators (TIs) at the nanoscale and at interfaces can strongly affect the physics of topological materials. Therefore, a detailed understanding of surface states and interface coupling is crucial to the search for and applications of new topological phases of matter. Currently, no methods can provide depth profiling near surfaces or at interfaces of topologically inequivalent materials. Such a method could advance the study of interactions. Herein, we present a noninvasive depth-profiling technique based on β-detected NMR (β-NMR) spectroscopy of radioactive 8Li+ ions that can provide "one-dimensional imaging" in films of fixed thickness and generates nanoscale views of the electronic wavefunctions and magnetic order at topological surfaces and interfaces. By mapping the 8Li nuclear resonance near the surface and 10-nm deep into the bulk of pure and Cr-doped bismuth antimony telluride films, we provide signatures related to the TI properties and their topological nontrivial characteristics that affect the electron-nuclear hyperfine field, the metallic shift, and magnetic order. These nanoscale variations in β-NMR parameters reflect the unconventional properties of the topological materials under study, and understanding the role of heterogeneities is expected to lead to the discovery of novel phenomena involving quantum materials.

Original languageEnglish
Pages (from-to)E3645-E3650
JournalProceedings of the National Academy of Sciences of the United States of America
Volume112
Issue number28
DOIs
Publication statusPublished - Jul 14 2015

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insulators
nuclear magnetic resonance
tellurides
antimony
bismuth
signatures
physics
shift
electronics
spectroscopy
ions
electrons
interactions

Keywords

  • Condensed matter physics
  • Depth profiling
  • Nanoscale physics
  • Nuclear magnetic resonance
  • Topological insulator

ASJC Scopus subject areas

  • General

Cite this

Nanoscale β-nuclear magnetic resonance depth imaging of topological insulators. / Koumoulis, Dimitrios; Morris, Gerald D.; He, Liang; Kou, Xufeng; King, Danny; Wang, Dong; Hossain, Masrur D.; Wang, Kang L.; Fiete, Gregory A.; Kanatzidis, Mercouri G; Bouchard, Louis S.

In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 112, No. 28, 14.07.2015, p. E3645-E3650.

Research output: Contribution to journalArticle

Koumoulis, D, Morris, GD, He, L, Kou, X, King, D, Wang, D, Hossain, MD, Wang, KL, Fiete, GA, Kanatzidis, MG & Bouchard, LS 2015, 'Nanoscale β-nuclear magnetic resonance depth imaging of topological insulators', Proceedings of the National Academy of Sciences of the United States of America, vol. 112, no. 28, pp. E3645-E3650. https://doi.org/10.1073/pnas.1502330112
Koumoulis, Dimitrios ; Morris, Gerald D. ; He, Liang ; Kou, Xufeng ; King, Danny ; Wang, Dong ; Hossain, Masrur D. ; Wang, Kang L. ; Fiete, Gregory A. ; Kanatzidis, Mercouri G ; Bouchard, Louis S. / Nanoscale β-nuclear magnetic resonance depth imaging of topological insulators. In: Proceedings of the National Academy of Sciences of the United States of America. 2015 ; Vol. 112, No. 28. pp. E3645-E3650.
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