Nanoscale measurements in organic memory devices from C60 in insulating polymers

Alokik Kanwal, Manish Chhowalla

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


Following our pervious works demonstrating all-organic memory devices based on a nanocomposite material consisting of C60 molecules dispersed in an insulating polymer. In this paper, we will report on conducting atomic force microscopy (c-AFM) measurements from nanosized regions on memory devices. The c-AFM nanoscale measurements show a hysteresis of high and low conductance states, in agreement with our previous reports on macroscopic memory devices. The c-AFM measurements were verified by 30nm gap cell devices fabricated via e-beam lithography, which also showed similar current values. Analysis of our data reveals that the conduction mechanism switches from direct tunneling to Fowler-Nordheim tunneling above a threshold voltage.

Original languageEnglish
Title of host publicationMaterials for Transparent Electronics
PublisherMaterials Research Society
Number of pages6
ISBN (Print)1558998608, 9781558998605
Publication statusPublished - Jan 1 2005
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 28 2005Dec 2 2005

Publication series

NameMaterials Research Society Symposium Proceedings
ISSN (Print)0272-9172


Other2005 MRS Fall Meeting
CountryUnited States
CityBoston, MA

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Kanwal, A., & Chhowalla, M. (2005). Nanoscale measurements in organic memory devices from C60 in insulating polymers. In Materials for Transparent Electronics (pp. 59-64). (Materials Research Society Symposium Proceedings; Vol. 905). Materials Research Society.