Nanostructured arrays formed by finely focused ion beams

R. A. Zuhr, J. D. Budai, P. G. Datskos, A. Meldrum, K. A. Thomas, R. J. Warmack, C. W. White, Leonard C Feldman, M. Strobel, K. H. Heinig

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

Amorphous, polycrystalline, and single crystal nanometer dimension particles can be formed in a variety of substrates by ion implantation and subsequent annealing. Such composite colloidal materials exhibit unique optical properties that could be useful in optical devices, switches, and waveguides. However colloids formed by blanket implantation are not uniform in size due to the nonuniform density of the implant, resulting in diminution of the size dependent optical properties. The object of the present work is to form more uniform size particles arranged in a 2-dimensional lattice by using a finely focused ion beam to implant identical ion doses only into nanometer size regions located at each point of a rectangular lattice. Initial work is being done with a 30 keV Ga beam implanted into Si. Results of particle formation as a function of implant conditions as analyzed by Rutherford backscattering, x-ray analysis, atomic force microscopy, and both scanning and transmission electron microscopy will be presented and discussed.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages251-256
Number of pages6
Volume536
Publication statusPublished - 1999
EventProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA
Duration: Nov 30 1998Dec 3 1998

Other

OtherProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998'
CityBoston, MA, USA
Period11/30/9812/3/98

Fingerprint

Focused ion beams
Optical properties
Rutherford backscattering spectroscopy
Colloids
Optical devices
Ion implantation
Atomic force microscopy
Waveguides
Particle size
Switches
Single crystals
Annealing
Ions
Transmission electron microscopy
X rays
Scanning electron microscopy
Composite materials
Substrates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Zuhr, R. A., Budai, J. D., Datskos, P. G., Meldrum, A., Thomas, K. A., Warmack, R. J., ... Heinig, K. H. (1999). Nanostructured arrays formed by finely focused ion beams. In Materials Research Society Symposium - Proceedings (Vol. 536, pp. 251-256). Materials Research Society.

Nanostructured arrays formed by finely focused ion beams. / Zuhr, R. A.; Budai, J. D.; Datskos, P. G.; Meldrum, A.; Thomas, K. A.; Warmack, R. J.; White, C. W.; Feldman, Leonard C; Strobel, M.; Heinig, K. H.

Materials Research Society Symposium - Proceedings. Vol. 536 Materials Research Society, 1999. p. 251-256.

Research output: Chapter in Book/Report/Conference proceedingChapter

Zuhr, RA, Budai, JD, Datskos, PG, Meldrum, A, Thomas, KA, Warmack, RJ, White, CW, Feldman, LC, Strobel, M & Heinig, KH 1999, Nanostructured arrays formed by finely focused ion beams. in Materials Research Society Symposium - Proceedings. vol. 536, Materials Research Society, pp. 251-256, Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998', Boston, MA, USA, 11/30/98.
Zuhr RA, Budai JD, Datskos PG, Meldrum A, Thomas KA, Warmack RJ et al. Nanostructured arrays formed by finely focused ion beams. In Materials Research Society Symposium - Proceedings. Vol. 536. Materials Research Society. 1999. p. 251-256
Zuhr, R. A. ; Budai, J. D. ; Datskos, P. G. ; Meldrum, A. ; Thomas, K. A. ; Warmack, R. J. ; White, C. W. ; Feldman, Leonard C ; Strobel, M. ; Heinig, K. H. / Nanostructured arrays formed by finely focused ion beams. Materials Research Society Symposium - Proceedings. Vol. 536 Materials Research Society, 1999. pp. 251-256
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