Near-field infrared sum-frequency generation imaging of chemical vapor deposited zinc selenide

Richard D Schaller, Richard J. Saykally

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Infrared sum-frequency generation (SFG) has been detected with near-field scanning optical microscopy (NSOM) for the first time. SFG NSOM images of a chemical vapor deposited (CVD) disk of zinc selenide were recorded as a function of infrared (IR) wavelengths ranging from 3.1 to 4.4 μm from an amplified femtosecond laser. Striation patterns, which are not observed in the topography, were detected in the optical images and exhibited increased SFG in comparison to homogeneous regions of the semiconductor. SFG images were demonstrated to have ∼ λ/20 spatial resolution in comparison to the IR wavelengths used to produce the sum frequency.

Original languageEnglish
Pages (from-to)2055-2058
Number of pages4
JournalLangmuir
Volume17
Issue number7
DOIs
Publication statusPublished - Apr 3 2001

Fingerprint

zinc selenides
Near field scanning optical microscopy
near fields
Zinc
Vapors
vapors
Infrared radiation
Imaging techniques
Wavelength
Ultrashort pulses
Topography
microscopy
scanning
striation
Semiconductor materials
wavelengths
topography
spatial resolution
zinc selenide
lasers

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Near-field infrared sum-frequency generation imaging of chemical vapor deposited zinc selenide. / Schaller, Richard D; Saykally, Richard J.

In: Langmuir, Vol. 17, No. 7, 03.04.2001, p. 2055-2058.

Research output: Contribution to journalArticle

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