Near-field scanning photocurrent microscopy of a nanowire photodetector

Y. Gu, E. S. Kwak, J. L. Lensch, J. E. Allen, Teri W Odom, L. J. Lauhon

Research output: Contribution to journal › Article

186 Citations (Scopus)

Abstract

A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (

Original languageEnglish
Article number043111
JournalApplied Physics Letters
Volume87
Issue number4
DOIs
Publication statusPublished - Jul 25 2005

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photocurrents
photometers
near fields
nanowires
microscopy
scanning
metals
dark current
optical microscopes
illumination

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Gu, Y., Kwak, E. S., Lensch, J. L., Allen, J. E., Odom, T. W., & Lauhon, L. J. (2005). Near-field scanning photocurrent microscopy of a nanowire photodetector. Applied Physics Letters, 87(4), [043111]. https://doi.org/10.1063/1.1996851

Near-field scanning photocurrent microscopy of a nanowire photodetector. / Gu, Y.; Kwak, E. S.; Lensch, J. L.; Allen, J. E.; Odom, Teri W; Lauhon, L. J.

In: Applied Physics Letters, Vol. 87, No. 4, 043111, 25.07.2005.

Research output: Contribution to journal › Article

Gu, Y, Kwak, ES, Lensch, JL, Allen, JE, Odom, TW & Lauhon, LJ 2005, 'Near-field scanning photocurrent microscopy of a nanowire photodetector', Applied Physics Letters, vol. 87, no. 4, 043111. https://doi.org/10.1063/1.1996851
Gu Y, Kwak ES, Lensch JL, Allen JE, Odom TW, Lauhon LJ. Near-field scanning photocurrent microscopy of a nanowire photodetector. Applied Physics Letters. 2005 Jul 25;87(4). 043111. https://doi.org/10.1063/1.1996851
Gu, Y. ; Kwak, E. S. ; Lensch, J. L. ; Allen, J. E. ; Odom, Teri W ; Lauhon, L. J. / Near-field scanning photocurrent microscopy of a nanowire photodetector. In: Applied Physics Letters. 2005 ; Vol. 87, No. 4.
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