Near-field scanning photocurrent microscopy of a nanowire photodetector

Y. Gu, E. S. Kwak, J. L. Lensch, J. E. Allen, T. W. Odom, L. J. Lauhon

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189 Citations (Scopus)

Abstract

A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (<2 pA) under uniform monochromatic illumination; under local illumination, the photoresponse was localized to the near-contact regions. Analysis of the spatial variation and bias dependence of the local photocurrent allowed the mechanisms of photocarrier transport and collection to be identified, highlighting the importance of near-field scanning photocurrent microscopy to elucidating the operating principles of nanowire devices.

Original languageEnglish
Article number043111
JournalApplied Physics Letters
Volume87
Issue number4
DOIs
Publication statusPublished - Jul 25 2005

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Gu, Y., Kwak, E. S., Lensch, J. L., Allen, J. E., Odom, T. W., & Lauhon, L. J. (2005). Near-field scanning photocurrent microscopy of a nanowire photodetector. Applied Physics Letters, 87(4), [043111]. https://doi.org/10.1063/1.1996851