Abstract
A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (<2 pA) under uniform monochromatic illumination; under local illumination, the photoresponse was localized to the near-contact regions. Analysis of the spatial variation and bias dependence of the local photocurrent allowed the mechanisms of photocarrier transport and collection to be identified, highlighting the importance of near-field scanning photocurrent microscopy to elucidating the operating principles of nanowire devices.
| Original language | English |
|---|---|
| Article number | 043111 |
| Journal | Applied Physics Letters |
| Volume | 87 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Jul 25 2005 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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Gu, Y., Kwak, E. S., Lensch, J. L., Allen, J. E., Odom, T. W., & Lauhon, L. J. (2005). Near-field scanning photocurrent microscopy of a nanowire photodetector. Applied Physics Letters, 87(4), [043111]. https://doi.org/10.1063/1.1996851