Near-field scanning photocurrent microscopy of a nanowire photodetector

Y. Gu; E. S. Kwak; J. L. Lensch; J. E. Allen; T. W. Odom; L. J. Lauhon

doi:10.1063/1.1996851

Near-field scanning photocurrent microscopy of a nanowire photodetector

Y. Gu, E. S. Kwak, J. L. Lensch, J. E. Allen, T. W. Odom, L. J. Lauhon

Northwestern University

Research output: Contribution to journal › Article › peer-review

192 Citations (Scopus)

Abstract

A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (<2 pA) under uniform monochromatic illumination; under local illumination, the photoresponse was localized to the near-contact regions. Analysis of the spatial variation and bias dependence of the local photocurrent allowed the mechanisms of photocarrier transport and collection to be identified, highlighting the importance of near-field scanning photocurrent microscopy to elucidating the operating principles of nanowire devices.

Original language	English
Article number	043111
Journal	Applied Physics Letters
Volume	87
Issue number	4
DOIs	https://doi.org/10.1063/1.1996851
Publication status	Published - Jul 25 2005

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (<2 pA) under uniform monochromatic illumination; under local illumination, the photoresponse was localized to the near-contact regions. Analysis of the spatial variation and bias dependence of the local photocurrent allowed the mechanisms of photocarrier transport and collection to be identified, highlighting the importance of near-field scanning photocurrent microscopy to elucidating the operating principles of nanowire devices.",

author = "Y. Gu and Kwak, {E. S.} and Lensch, {J. L.} and Allen, {J. E.} and Odom, {T. W.} and Lauhon, {L. J.}",

note = "Funding Information: This work was supported by Northwestern University, the Semiconductor Research Corporation, the National Science Foundation, and the David and Lucille Packard Foundation. J.L.L. acknowledges the support of a National Science Foundation Graduate Research Fellowship.",

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AU - Kwak, E. S.

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AU - Allen, J. E.

AU - Odom, T. W.

AU - Lauhon, L. J.

N1 - Funding Information: This work was supported by Northwestern University, the Semiconductor Research Corporation, the National Science Foundation, and the David and Lucille Packard Foundation. J.L.L. acknowledges the support of a National Science Foundation Graduate Research Fellowship.

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Near-field scanning photocurrent microscopy of a nanowire photodetector

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