Abstract
A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (<2 pA) under uniform monochromatic illumination; under local illumination, the photoresponse was localized to the near-contact regions. Analysis of the spatial variation and bias dependence of the local photocurrent allowed the mechanisms of photocarrier transport and collection to be identified, highlighting the importance of near-field scanning photocurrent microscopy to elucidating the operating principles of nanowire devices.
Original language | English |
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Article number | 043111 |
Journal | Applied Physics Letters |
Volume | 87 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jul 25 2005 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)