Near-field scanning photocurrent microscopy of a nanowire photodetector

Y. Gu, E. S. Kwak, J. L. Lensch, J. E. Allen, Teri W Odom, L. J. Lauhon

Research output: Contribution to journalArticle

184 Citations (Scopus)

Abstract

A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (

Original languageEnglish
Article number043111
JournalApplied Physics Letters
Volume87
Issue number4
DOIs
Publication statusPublished - Jul 25 2005

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photocurrents
photometers
near fields
nanowires
microscopy
scanning
metals
dark current
optical microscopes
illumination

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Gu, Y., Kwak, E. S., Lensch, J. L., Allen, J. E., Odom, T. W., & Lauhon, L. J. (2005). Near-field scanning photocurrent microscopy of a nanowire photodetector. Applied Physics Letters, 87(4), [043111]. https://doi.org/10.1063/1.1996851

Near-field scanning photocurrent microscopy of a nanowire photodetector. / Gu, Y.; Kwak, E. S.; Lensch, J. L.; Allen, J. E.; Odom, Teri W; Lauhon, L. J.

In: Applied Physics Letters, Vol. 87, No. 4, 043111, 25.07.2005.

Research output: Contribution to journalArticle

Gu, Y. ; Kwak, E. S. ; Lensch, J. L. ; Allen, J. E. ; Odom, Teri W ; Lauhon, L. J. / Near-field scanning photocurrent microscopy of a nanowire photodetector. In: Applied Physics Letters. 2005 ; Vol. 87, No. 4.
@article{8d30cd2d09ec47abad4efbe51aa4f55c,
title = "Near-field scanning photocurrent microscopy of a nanowire photodetector",
abstract = "A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (",
author = "Y. Gu and Kwak, {E. S.} and Lensch, {J. L.} and Allen, {J. E.} and Odom, {Teri W} and Lauhon, {L. J.}",
year = "2005",
month = "7",
day = "25",
doi = "10.1063/1.1996851",
language = "English",
volume = "87",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "4",

}

TY - JOUR

T1 - Near-field scanning photocurrent microscopy of a nanowire photodetector

AU - Gu, Y.

AU - Kwak, E. S.

AU - Lensch, J. L.

AU - Allen, J. E.

AU - Odom, Teri W

AU - Lauhon, L. J.

PY - 2005/7/25

Y1 - 2005/7/25

N2 - A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (

AB - A near-field scanning optical microscope was used to image the photocurrent induced by local illumination along the length of a metal-semiconductor-metal (MSM) photodetector made from an individual CdS nanowire. Nanowire MSM photodetectors exhibited photocurrents ∼ 105 larger than the dark current (

UR - http://www.scopus.com/inward/record.url?scp=23744464344&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=23744464344&partnerID=8YFLogxK

U2 - 10.1063/1.1996851

DO - 10.1063/1.1996851

M3 - Article

VL - 87

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 4

M1 - 043111

ER -