Nitrogen and hydrogen induced trap passivation at the SiO 2/4H-SiC interface

S. Dhar, S. Wang, A. C. Ahyi, T. Isaacs-Smith, S. T. Pantelides, J. R. Williams, L. C. Feldman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

34 Citations (Scopus)

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