Nuclear coupling and polarization in molecular transport junctions: Beyond tunneling to function

Michael Galperin, Mark A Ratner, Abraham Nitzan, Alessandro Troisi

Research output: Contribution to journalArticle

235 Citations (Scopus)

Abstract

Much current experimental research on transport in molecular junctions focuses on finite voltages, where substantial polarization-induced nonlinearities may result in technologically relevant device-type responses. Because molecules have strong polarization responses to changing charge state or external field, molecules isolated between electrodes can show strongly nonlinear current-voltage responses. For small applied voltages (up to ∼0.3 volt), weak interaction between transporting electrons and molecular vibrations provides the basis for inelastic electron tunneling spectroscopy. At higher voltages and for certain time scale regimes, strong coupling effects occur, including Coulomb blockade, negative differential resistance, dynamical switching and switching noise, current hysteresis, heating, and chemical reactions. We discuss a general picture for such phenomena that arise from charging, strong correlation, and polarization (electronic and vibrational) effects in the molecule and at the interface.

Original languageEnglish
Pages (from-to)1056-1060
Number of pages5
JournalScience
Volume319
Issue number5866
DOIs
Publication statusPublished - Feb 22 2008

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Electrons
Vibration
Heating
Noise
Spectrum Analysis
Electrodes
Equipment and Supplies
Research

ASJC Scopus subject areas

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Cite this

Nuclear coupling and polarization in molecular transport junctions : Beyond tunneling to function. / Galperin, Michael; Ratner, Mark A; Nitzan, Abraham; Troisi, Alessandro.

In: Science, Vol. 319, No. 5866, 22.02.2008, p. 1056-1060.

Research output: Contribution to journalArticle

Galperin, Michael ; Ratner, Mark A ; Nitzan, Abraham ; Troisi, Alessandro. / Nuclear coupling and polarization in molecular transport junctions : Beyond tunneling to function. In: Science. 2008 ; Vol. 319, No. 5866. pp. 1056-1060.
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