Abstract
We report the observation of a (5×5) reconstruction on the pure Si (111) surface, which is induced and stabilized by a tensile strain. The stabilization is so strong that the reconstruction survives extended exposure to air and the formation of a native oxide layer. Modeling of experimental high-resolution transmission-electron-microscope profile images indicates that the native oxide is ordered. The (5×5) reconstruction can also be induced at an initially unreconstructed Si-oxide interface by application of tension and appropriate annealing.
| Original language | English |
|---|---|
| Pages (from-to) | 1332-1335 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 57 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1986 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Observation of (5×5) surface reconstruction on pure silicon and its stability against native-oxide Formation. / Ourmazd, A.; Taylor, D. W.; Bevk, J.; Davidson, B. A.; Feldman, Leonard C; Mannaerts, J. P.
In: Physical Review Letters, Vol. 57, No. 11, 1986, p. 1332-1335.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Observation of (5×5) surface reconstruction on pure silicon and its stability against native-oxide Formation
AU - Ourmazd, A.
AU - Taylor, D. W.
AU - Bevk, J.
AU - Davidson, B. A.
AU - Feldman, Leonard C
AU - Mannaerts, J. P.
PY - 1986
Y1 - 1986
N2 - We report the observation of a (5×5) reconstruction on the pure Si (111) surface, which is induced and stabilized by a tensile strain. The stabilization is so strong that the reconstruction survives extended exposure to air and the formation of a native oxide layer. Modeling of experimental high-resolution transmission-electron-microscope profile images indicates that the native oxide is ordered. The (5×5) reconstruction can also be induced at an initially unreconstructed Si-oxide interface by application of tension and appropriate annealing.
AB - We report the observation of a (5×5) reconstruction on the pure Si (111) surface, which is induced and stabilized by a tensile strain. The stabilization is so strong that the reconstruction survives extended exposure to air and the formation of a native oxide layer. Modeling of experimental high-resolution transmission-electron-microscope profile images indicates that the native oxide is ordered. The (5×5) reconstruction can also be induced at an initially unreconstructed Si-oxide interface by application of tension and appropriate annealing.
UR - http://www.scopus.com/inward/record.url?scp=34047251068&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34047251068&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.57.1332
DO - 10.1103/PhysRevLett.57.1332
M3 - Article
AN - SCOPUS:34047251068
VL - 57
SP - 1332
EP - 1335
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 11
ER -