Observation of a (5 × 5) leed pattern from GexSi1-x(111) alloys

H. J. Gossmann; J. C. Bean; Leonard C Feldman; W. M. Gibson

doi:10.1016/0039-6028(84)90247-4

Observation of a (5 × 5) leed pattern from GexSi1-x(111) alloys

H. J. Gossmann, J. C. Bean, Leonard C Feldman, W. M. Gibson

Rutgers University

Research output: Contribution to journal › Article

66 Citations (Scopus)

Abstract

A sharp (5 × 5) low energy electron diffraction pattern has been observed in Ge_xSi_1-x(111) alloy films grown by molecular beam epitaxy on Si(111). This paper describes the growth conditions for this structure and possible implications for semiconductor surface structure analysis.

Original language	English
Journal	Surface Science
Volume	138
Issue number	2-3
DOIs	https://doi.org/10.1016/0039-6028(84)90247-4
Publication status	Published - Mar 2 1984

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Condensed Matter Physics
Surfaces and Interfaces

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Gossmann, H. J., Bean, J. C., Feldman, L. C., & Gibson, W. M. (1984). Observation of a (5 × 5) leed pattern from GexSi1-x(111) alloys. Surface Science, 138(2-3). https://doi.org/10.1016/0039-6028(84)90247-4

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