Optical and structural characterization of copper indium disulfide thin films

D. O. Henderson, R. Mu, A. Ueda, M. H. Wu, E. M. Gordon, Y. S. Tung, M. Huang, J. Keay, Leonard C Feldman, J. A. Hollingsworth, W. E. Buhro, J. D. Harris, A. F. Hepp, R. P. Raffaelle

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Thin films of copper indium disulfide (CuInS2) were synthesized by spray chemical vapor deposition. Rutherford backscattering measurements were used to determine the composition and thickness of the films. The elemental ratios were found to be within 2% of stoichiometrically correct CuInS2. The thickness of the films was found to be approximately 1.0 μm. An optical band-gap of approximately 1.44 eV for this material was determined by optical transmission spectroscopy. Reflectance spectroscopy identified phonon bands centered at 225,291 and 317 cm-1.

Original languageEnglish
Pages (from-to)585-589
Number of pages5
JournalMaterials and Design
Volume22
Issue number7
Publication statusPublished - 2001

Fingerprint

Indium
Disulfides
Copper
Spectroscopy
Thin films
Optical band gaps
Rutherford backscattering spectroscopy
Light transmission
Chemical vapor deposition
Chemical analysis

Keywords

  • Optical
  • Semi-conductors
  • Vapour deposition

ASJC Scopus subject areas

  • Polymers and Plastics
  • Industrial and Manufacturing Engineering
  • Ceramics and Composites

Cite this

Henderson, D. O., Mu, R., Ueda, A., Wu, M. H., Gordon, E. M., Tung, Y. S., ... Raffaelle, R. P. (2001). Optical and structural characterization of copper indium disulfide thin films. Materials and Design, 22(7), 585-589.

Optical and structural characterization of copper indium disulfide thin films. / Henderson, D. O.; Mu, R.; Ueda, A.; Wu, M. H.; Gordon, E. M.; Tung, Y. S.; Huang, M.; Keay, J.; Feldman, Leonard C; Hollingsworth, J. A.; Buhro, W. E.; Harris, J. D.; Hepp, A. F.; Raffaelle, R. P.

In: Materials and Design, Vol. 22, No. 7, 2001, p. 585-589.

Research output: Contribution to journalArticle

Henderson, DO, Mu, R, Ueda, A, Wu, MH, Gordon, EM, Tung, YS, Huang, M, Keay, J, Feldman, LC, Hollingsworth, JA, Buhro, WE, Harris, JD, Hepp, AF & Raffaelle, RP 2001, 'Optical and structural characterization of copper indium disulfide thin films', Materials and Design, vol. 22, no. 7, pp. 585-589.
Henderson DO, Mu R, Ueda A, Wu MH, Gordon EM, Tung YS et al. Optical and structural characterization of copper indium disulfide thin films. Materials and Design. 2001;22(7):585-589.
Henderson, D. O. ; Mu, R. ; Ueda, A. ; Wu, M. H. ; Gordon, E. M. ; Tung, Y. S. ; Huang, M. ; Keay, J. ; Feldman, Leonard C ; Hollingsworth, J. A. ; Buhro, W. E. ; Harris, J. D. ; Hepp, A. F. ; Raffaelle, R. P. / Optical and structural characterization of copper indium disulfide thin films. In: Materials and Design. 2001 ; Vol. 22, No. 7. pp. 585-589.
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