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Optical and structural characterization of copper indium disulfide thin films
D. O. Henderson, R. Mu, A. Ueda, M. H. Wu, E. M. Gordon, Y. S. Tung, M. Huang, J. Keay, L. C. Feldman, J. A. Hollingsworth, W. E. Buhro, J. D. Harris, A. F. Hepp, R. P. Raffaelle
Research output: Contribution to journal › Article › peer-review
25
Citations
(Scopus)