Optical and structural characterization of copper indium disulfide thin films

D. O. Henderson, R. Mu, A. Ueda, M. H. Wu, E. M. Gordon, Y. S. Tung, M. Huang, J. Keay, L. C. Feldman, J. A. Hollingsworth, W. E. Buhro, J. D. Harris, A. F. Hepp, R. P. Raffaelle

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Chemical Compounds

Engineering & Materials Science