Optical limiting and excited-state absorption in fullerene solutions and doped glasses

Duncan W. McBranch, Laura B. Smilowitz, Victor I Klimov, A. Koskelo, Jeanne M. Robinson, Ben R. Mattes, J. C. Hummelen, F. Wudl, James C. Withers, Nicholas F. Borrelli

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

We report the ground-state and excited-state optical absorption spectra in the visible and near infrared for several substituted fullerenes and higher fullerenes in toluene solutions. Based on these measurements, broadband predictions of the optical limiting performance of these molecules can be deduced. These predictions are then tested in the wavelength range from 532 nm to 700 nm in intensity-dependent transmission measurements. We observe optical limiting in all fullerenes measured; higher fullerenes show the greatest potential for limiting in the near infrared (650 - 1000 nm), while substituted C 60 shows optimal limiting in the visible (450 - 700 nm). We observe dramatically reduced limiting for solid forms of C 60 (thin films and C 60-doped porous glasses), indicating that efficient optical limiting in fullerenes requires true molecular solutions.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsZakya H. Kafafi
Pages196-204
Number of pages9
Volume2530
Publication statusPublished - 1995
EventFullerenes and Photonics II - San Diego, CA, USA
Duration: Jul 10 1995Jul 11 1995

Other

OtherFullerenes and Photonics II
CitySan Diego, CA, USA
Period7/10/957/11/95

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    McBranch, D. W., Smilowitz, L. B., Klimov, V. I., Koskelo, A., Robinson, J. M., Mattes, B. R., Hummelen, J. C., Wudl, F., Withers, J. C., & Borrelli, N. F. (1995). Optical limiting and excited-state absorption in fullerene solutions and doped glasses. In Z. H. Kafafi (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2530, pp. 196-204)