Abstract
A method is tested for analyzing color video images to determine film thickness for transparent coatings on silicon. The method is robust to reasonable variations in light level, video parameters, and computer image capture spectral characteristics. The main standardizing feature of the method is to include characterization of a bare substrate along with the unknown samples (either within the view frame or as a separate sequence under identical illumination conditions during video capture). Then, the color appearance for the unknown sample can be referenced to the color appearance of the bare substrate, thereby enabling a quantitative match between the measured color and the predicted color characteristics. The technique is tested with transparent spin-on-glass (SOG) coatings that were calibrated separately. The limits of applicability and the level of accuracy that can be obtained are discussed in detail.
| Original language | English |
|---|---|
| Pages (from-to) | 2795-2800 |
| Number of pages | 6 |
| Journal | Materials Letters |
| Volume | 58 |
| Issue number | 22-23 |
| DOIs | |
| Publication status | Published - Sep 2004 |
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Keywords
- Coatings
- Optical properties
- Spin-on-glass
- Video
ASJC Scopus subject areas
- Materials Science(all)
Cite this
Optical video interpretation of interference colors from thin transparent films on silicon. / Birnie, Dunbar P.
In: Materials Letters, Vol. 58, No. 22-23, 09.2004, p. 2795-2800.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Optical video interpretation of interference colors from thin transparent films on silicon
AU - Birnie, Dunbar P
PY - 2004/9
Y1 - 2004/9
N2 - A method is tested for analyzing color video images to determine film thickness for transparent coatings on silicon. The method is robust to reasonable variations in light level, video parameters, and computer image capture spectral characteristics. The main standardizing feature of the method is to include characterization of a bare substrate along with the unknown samples (either within the view frame or as a separate sequence under identical illumination conditions during video capture). Then, the color appearance for the unknown sample can be referenced to the color appearance of the bare substrate, thereby enabling a quantitative match between the measured color and the predicted color characteristics. The technique is tested with transparent spin-on-glass (SOG) coatings that were calibrated separately. The limits of applicability and the level of accuracy that can be obtained are discussed in detail.
AB - A method is tested for analyzing color video images to determine film thickness for transparent coatings on silicon. The method is robust to reasonable variations in light level, video parameters, and computer image capture spectral characteristics. The main standardizing feature of the method is to include characterization of a bare substrate along with the unknown samples (either within the view frame or as a separate sequence under identical illumination conditions during video capture). Then, the color appearance for the unknown sample can be referenced to the color appearance of the bare substrate, thereby enabling a quantitative match between the measured color and the predicted color characteristics. The technique is tested with transparent spin-on-glass (SOG) coatings that were calibrated separately. The limits of applicability and the level of accuracy that can be obtained are discussed in detail.
KW - Coatings
KW - Optical properties
KW - Spin-on-glass
KW - Video
UR - http://www.scopus.com/inward/record.url?scp=3242669767&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3242669767&partnerID=8YFLogxK
U2 - 10.1016/j.matlet.2004.04.018
DO - 10.1016/j.matlet.2004.04.018
M3 - Article
AN - SCOPUS:3242669767
VL - 58
SP - 2795
EP - 2800
JO - Materials Letters
JF - Materials Letters
SN - 0167-577X
IS - 22-23
ER -