Oxygen transport and surface exchange properties of Sr0.5Sm 0.5CoO3-δ

Ted C. Yeh, Jules L. Routbort, Thomas O Mason

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Oxygen tracer diffusion (Dâ) and chemical diffusion (DËœ) were measured in dense Sr0.5Sm0.5CoO 3 - δ (SSC) ceramics by Isotope Exchange Depth Profiling/Secondary Ion Mass Spectrometry (IEDP/SIMS) and electrical conductivity relaxation (ECR) over the temperature ranges of ∼100-200 C and 400-600 C, respectively. In addition, the surface exchange coefficients were determined over the same temperature ranges. The transport properties and exchange kinetics of SSC are comparable to or better than those of other solid oxide fuel cell cathode candidates in the literature. The ionic conductivity of SSC was calculated using the Nernst-Einstein equation, and is comparable to that of leading solid oxide electrolytes at intermediate temperatures.

Original languageEnglish
Pages (from-to)138-143
Number of pages6
JournalSolid State Ionics
Volume232
DOIs
Publication statusPublished - 2013

Fingerprint

Oxygen
oxygen
cell cathodes
Depth profiling
Ionic conductivity
Einstein equations
solid oxide fuel cells
Secondary ion mass spectrometry
Solid oxide fuel cells (SOFC)
Isotopes
Transport properties
Temperature
Oxides
secondary ion mass spectrometry
ion currents
Electrolytes
tracers
temperature
Cathodes
isotopes

Keywords

  • Cathode
  • Chemical diffusivity
  • Solid oxide fuel cell
  • SrSmCoO
  • Surface exchange coefficient
  • Tracer diffusivity

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Chemistry(all)

Cite this

Oxygen transport and surface exchange properties of Sr0.5Sm 0.5CoO3-δ. / Yeh, Ted C.; Routbort, Jules L.; Mason, Thomas O.

In: Solid State Ionics, Vol. 232, 2013, p. 138-143.

Research output: Contribution to journalArticle

Yeh, Ted C. ; Routbort, Jules L. ; Mason, Thomas O. / Oxygen transport and surface exchange properties of Sr0.5Sm 0.5CoO3-δ. In: Solid State Ionics. 2013 ; Vol. 232. pp. 138-143.
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