Photoluminescence in poly(3-hexylthiophene)

Ifor D W Samuel, Laura Magnani, Gary Rumbles, Ken Murray, Bradley M. Stone, Stephen C. Moratti, Andrew B. Holmes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

We report a study of the photophysics of solutions and films of the conjugated polymer poly(3-hexylthiophene) (P3HT). We have performed measurements of absorption, photoluminescence (PL), PL quantum yield, and time-resolved PL. For P3HT in a good solvent the PL decays with a time constant of 510±20 ps, and the PL quantum yield is 0.42±0.04. we assign the PL to the intra-chain singlet exciton, and deduce a natural radiative lifetime for this species of 1.2±0.1 ns. We explore the use of solvent mixture as a way of controlling the degree of intermolecular interaction. We find that there is a red-shift of absorption and PL in poor solvent mixtures, and the spectra and PL quantum yield become similar to the film. The PL decay becomes faster and non-exponential in poor solvent mixtures and the thin film.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsZ.V. Vardeny, L.J. Rothberg
Pages163-170
Number of pages8
Volume3145
DOIs
Publication statusPublished - 1997
EventOptical Probes of Conjugated Polymers - San Diego, CA, United States
Duration: Jul 28 1997Jul 30 1997

Other

OtherOptical Probes of Conjugated Polymers
CountryUnited States
CitySan Diego, CA
Period7/28/977/30/97

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Keywords

  • Photoluminescence
  • Poly(3-hexylthiophene)
  • Quantum yield
  • Singlet exciton
  • Solvatochromism
  • Time-resolved spectroscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Samuel, I. D. W., Magnani, L., Rumbles, G., Murray, K., Stone, B. M., Moratti, S. C., & Holmes, A. B. (1997). Photoluminescence in poly(3-hexylthiophene). In Z. V. Vardeny, & L. J. Rothberg (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3145, pp. 163-170) https://doi.org/10.1117/12.279277