Abstract
A highly sensitive trap characterization technique based on wavelength- and polarization-resolved photocurrent excitation spectroscopy of single crystalline organic semiconductors is described. The method reveals that even a brief illumination of organic molecular crystals in an oxygen atmosphere triggers a long-term oxygen diffusion in the dark that results in formation of traps at depth scales comparable to the light penetration length.
Original language | English |
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Pages (from-to) | 981-985 |
Number of pages | 5 |
Journal | Advanced Materials |
Volume | 23 |
Issue number | 8 |
DOIs | |
Publication status | Published - Feb 22 2011 |
Keywords
- charge transport
- organic field-effect transistors
- organic semiconductors
- oxygen diffusion
- photoconductivity
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering