Abstract
A highly sensitive trap characterization technique based on wavelength- and polarization-resolved photocurrent excitation spectroscopy of single crystalline organic semiconductors is described. The method reveals that even a brief illumination of organic molecular crystals in an oxygen atmosphere triggers a long-term oxygen diffusion in the dark that results in formation of traps at depth scales comparable to the light penetration length.
| Original language | English |
|---|---|
| Pages (from-to) | 981-985 |
| Number of pages | 5 |
| Journal | Advanced Materials |
| Volume | 23 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Feb 22 2011 |
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Keywords
- charge transport
- organic field-effect transistors
- organic semiconductors
- oxygen diffusion
- photoconductivity
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
Cite this
Najafov, H., Mastrogiovanni, D., Garfunkel, E., Feldman, L. C., & Podzorov, V. (2011). Photon-assisted oxygen diffusion and oxygen-related traps in organic semiconductors. Advanced Materials, 23(8), 981-985. https://doi.org/10.1002/adma.201004239