Polytypoid structures in annealed In2O3-ZnO films

Y. Yan, S. J. Pennycook, J. Dai, Robert P. H. Chang, A. Wang, Tobin J Marks

Research output: Contribution to journalArticle

66 Citations (Scopus)

Abstract

Atomic-resolution Z-contrast images demonstrate unambiguously that the annealed, metalorganic chemical vapor deposition derived transparent In2O3-ZnO films have a polytypoid microstructure, consisting of ZnO slabs of variable width separated by single In-O octahedral layers. These In-O layers induce a polarity inversion in the two adjacent ZnO layers, which is reversed again by a mirror domain boundary inside each ZnO slab.

Original languageEnglish
Pages (from-to)2585-2587
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number18
DOIs
Publication statusPublished - 1998

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slabs
image contrast
metalorganic chemical vapor deposition
polarity
inversions
mirrors
microstructure

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Polytypoid structures in annealed In2O3-ZnO films. / Yan, Y.; Pennycook, S. J.; Dai, J.; Chang, Robert P. H.; Wang, A.; Marks, Tobin J.

In: Applied Physics Letters, Vol. 73, No. 18, 1998, p. 2585-2587.

Research output: Contribution to journalArticle

Yan, Y. ; Pennycook, S. J. ; Dai, J. ; Chang, Robert P. H. ; Wang, A. ; Marks, Tobin J. / Polytypoid structures in annealed In2O3-ZnO films. In: Applied Physics Letters. 1998 ; Vol. 73, No. 18. pp. 2585-2587.
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