Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Mark C Hersam, A. C F Hoole, S. J. O'Shea, M. E. Welland

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

Using an atomic force microscope equipped with a conducting diamond tip, the surface potential on a current carrying gold nanowire was measured with microvolt potential sensitivity and nanometer spatial resolution. Potentiometry images illustrate the stages of failure of nanowires subjected to current stressing. During this failure process, a discontinuity in the potential gradient and an enhanced resistance region were observed at the failure site until a complete fracture was formed. By increasing the repulsive force and accurately positioning the tip, gold could be manipulated into the nanoscale fracture so that the electrical conductivity of the nanowire was regained.

Original languageEnglish
Pages (from-to)915-917
Number of pages3
JournalApplied Physics Letters
Volume72
Issue number8
DOIs
Publication statusPublished - 1998

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potentiometric analysis
nanowires
atomic force microscopy
gold
potential gradients
positioning
discontinuity
spatial resolution
diamonds
microscopes
conduction
electrical resistivity
sensitivity

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. / Hersam, Mark C; Hoole, A. C F; O'Shea, S. J.; Welland, M. E.

In: Applied Physics Letters, Vol. 72, No. 8, 1998, p. 915-917.

Research output: Contribution to journalArticle

Hersam, Mark C ; Hoole, A. C F ; O'Shea, S. J. ; Welland, M. E. / Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. In: Applied Physics Letters. 1998 ; Vol. 72, No. 8. pp. 915-917.
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