Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes

Lian Wang, Yu Yang, Zhifu Liu, Tobin J Marks, Seng Tiong Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A series of highly near-infrared (MIR) transparent In2O 3 thin films has been grown by ion-assisted deposition (IAD) at room temperature, and their optical and electrical properties characterized. The NIR transparency and the plasma edge can be engineered through control of the film deposition conditions. The as-deposited In2O3 thin films were employed as transparent electrodes for direct electro-optic (EO) characterization measurements via the Teng-Man technique. Using LiNbO 3 as the standard, the relationship between the degree of electrode NIR transparency and Teng-Man EO measurement accuracy was evaluated. It is found that In2O3 electrodes can be tailored to be highly NIR transparent, thus providing more accurate Teng-Man EO coefficient quantification than ITO (tin-doped indium oxide). In addition, the EO coefficients of stilbazolium-based self-assembled superlattice (SAS) thin films were directly determined for the first time by the Teng-Man technique using an optimized In2O3 electrode. EO coefficients r33 of 42.2, 13.1, and 6.4 pm/V are obtained at 633, 1064, and 1310 nm, respectively.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
Pages37-49
Number of pages13
Volume928
Publication statusPublished - 2006
Event2006 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 17 2006Apr 21 2006

Other

Other2006 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/17/064/21/06

Fingerprint

Electrooptical effects
Infrared radiation
Electrodes
Thin films
Transparency
Tin
Indium
Electric properties
Optical properties
Ions
Plasmas
Oxides
Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Wang, L., Yang, Y., Liu, Z., Marks, T. J., & Ho, S. T. (2006). Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes. In Materials Research Society Symposium Proceedings (Vol. 928, pp. 37-49)

Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes. / Wang, Lian; Yang, Yu; Liu, Zhifu; Marks, Tobin J; Ho, Seng Tiong.

Materials Research Society Symposium Proceedings. Vol. 928 2006. p. 37-49.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wang, L, Yang, Y, Liu, Z, Marks, TJ & Ho, ST 2006, Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes. in Materials Research Society Symposium Proceedings. vol. 928, pp. 37-49, 2006 MRS Spring Meeting, San Francisco, CA, United States, 4/17/06.
Wang L, Yang Y, Liu Z, Marks TJ, Ho ST. Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes. In Materials Research Society Symposium Proceedings. Vol. 928. 2006. p. 37-49
Wang, Lian ; Yang, Yu ; Liu, Zhifu ; Marks, Tobin J ; Ho, Seng Tiong. / Precision Teng-Man electro-optic measurements using highly near-infrared transparent electrodes. Materials Research Society Symposium Proceedings. Vol. 928 2006. pp. 37-49
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