Preparation of STM tips for in‐situ characterization of electrode surfaces

Michael J. Heben; Moris M. Dovek; Nathan S. Lewis; Reginald M. Penner; Calvin F. Quate

doi:10.1111/j.1365-2818.1988.tb01434.x

Preparation of STM tips for in‐situ characterization of electrode surfaces

Michael J. Heben, Moris M. Dovek, Nathan S. Lewis, Reginald M. Penner, Calvin F. Quate

California Institute of Technology

Research output: Contribution to journal › Article

51 Citations (Scopus)

Abstract

The total current between the tip and the sample in a scanning tunnelling microscopy study of a solid/liquid interface can be dominated by Faradaic charge transfer currents. In such a situation, feedback control of the tunnelling gap, and imaging, is precluded. In this contribution we describe the preparation of glass and polymer coated STM tips that possess < 100 Å² of exposed metal. These tips effectively discriminate against Faradaic current and enable STM imaging in the presence of reversible electroactive solution species at appreciable tip/sample biases. 1988 Blackwell Science Ltd

Original language	English
Pages (from-to)	651-661
Number of pages	11
Journal	Journal of Microscopy
Volume	152
Issue number	3
DOIs	https://doi.org/10.1111/j.1365-2818.1988.tb01434.x
Publication status	Published - Dec 1988

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Keywords

STM
electrochemistry
tips

ASJC Scopus subject areas

Pathology and Forensic Medicine
Histology

Cite this

Heben, M. J., Dovek, M. M., Lewis, N. S., Penner, R. M., & Quate, C. F. (1988). Preparation of STM tips for in‐situ characterization of electrode surfaces. Journal of Microscopy, 152(3), 651-661. https://doi.org/10.1111/j.1365-2818.1988.tb01434.x

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10.1111/j.1365-2818.1988.tb01434.x