Preparation of STM tips for in‐situ characterization of electrode surfaces

Michael J. Heben, Moris M. Dovek, Nathan S Lewis, Reginald M. Penner, Calvin F. Quate

Research output: Contribution to journalArticle

51 Citations (Scopus)

Abstract

The total current between the tip and the sample in a scanning tunnelling microscopy study of a solid/liquid interface can be dominated by Faradaic charge transfer currents. In such a situation, feedback control of the tunnelling gap, and imaging, is precluded. In this contribution we describe the preparation of glass and polymer coated STM tips that possess < 100 Å2 of exposed metal. These tips effectively discriminate against Faradaic current and enable STM imaging in the presence of reversible electroactive solution species at appreciable tip/sample biases. 1988 Blackwell Science Ltd

Original languageEnglish
Pages (from-to)651-661
Number of pages11
JournalJournal of Microscopy
Volume152
Issue number3
DOIs
Publication statusPublished - 1988

Fingerprint

Scanning Tunnelling Microscopy
Glass
Polymers
Electrodes
Metals

Keywords

  • electrochemistry
  • STM
  • tips

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

Preparation of STM tips for in‐situ characterization of electrode surfaces. / Heben, Michael J.; Dovek, Moris M.; Lewis, Nathan S; Penner, Reginald M.; Quate, Calvin F.

In: Journal of Microscopy, Vol. 152, No. 3, 1988, p. 651-661.

Research output: Contribution to journalArticle

Heben, Michael J. ; Dovek, Moris M. ; Lewis, Nathan S ; Penner, Reginald M. ; Quate, Calvin F. / Preparation of STM tips for in‐situ characterization of electrode surfaces. In: Journal of Microscopy. 1988 ; Vol. 152, No. 3. pp. 651-661.
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