Probing carbon nanoparticles in CNx thin films using Raman spectroscopy

Debdulal Roy, Manish Chhowalla, Niklas Hellgren, T. W. Clyne, G. A J Amaratunga

Research output: Contribution to journalArticle

41 Citations (Scopus)

Abstract

Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CNx thin films is invoked to explain the possible origin of the near 700 cm-1 band. The shift in the G peak center and ID/IG ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.

Original languageEnglish
Article number035406
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume70
Issue number3
DOIs
Publication statusPublished - Jul 2004

Fingerprint

Raman spectroscopy
Carbon
nitrogenation
Nanoparticles
Thin films
nanoparticles
carbon nitrides
Graphite
Carbon nitride
carbon
thin films
Magnetron sputtering
Graphene
magnetron sputtering
graphene
curvature
shift
Temperature
temperature
cyanogen

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Probing carbon nanoparticles in CNx thin films using Raman spectroscopy. / Roy, Debdulal; Chhowalla, Manish; Hellgren, Niklas; Clyne, T. W.; Amaratunga, G. A J.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 70, No. 3, 035406, 07.2004.

Research output: Contribution to journalArticle

Roy, Debdulal ; Chhowalla, Manish ; Hellgren, Niklas ; Clyne, T. W. ; Amaratunga, G. A J. / Probing carbon nanoparticles in CNx thin films using Raman spectroscopy. In: Physical Review B - Condensed Matter and Materials Physics. 2004 ; Vol. 70, No. 3.
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