Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy

Carsten Georgi, Alexander A. Green, Mark C Hersam, Achim Hartschuh

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

We observe localization of excitons in semiconducting single-walled carbon nanotubes at room temperature using high-resolution near-field photoluminescence (PL) microscopy. Localization is the result of spatially confined exciton energy minima with depths of more than 15 meV connected to lateral energy gradients exceeding 2 meV/nm as evidenced by energy-resolved PL imaging. Simulations of exciton diffusion in the presence of energy variations support this interpretation predicting strongly enhanced PL at local energy minima.

Original languageEnglish
Pages (from-to)5914-5920
Number of pages7
JournalACS Nano
Volume4
Issue number10
DOIs
Publication statusPublished - Oct 26 2010

Fingerprint

Single-walled carbon nanotubes (SWCN)
Excitons
near fields
Photoluminescence
Microscopic examination
carbon nanotubes
excitons
microscopy
high resolution
photoluminescence
energy
Imaging techniques
LDS 751
gradients
room temperature
Temperature
simulation

Keywords

  • excitons
  • localization
  • near-field microscopy
  • photoluminescence
  • single-walled carbon nanotubes

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy. / Georgi, Carsten; Green, Alexander A.; Hersam, Mark C; Hartschuh, Achim.

In: ACS Nano, Vol. 4, No. 10, 26.10.2010, p. 5914-5920.

Research output: Contribution to journalArticle

Georgi, Carsten ; Green, Alexander A. ; Hersam, Mark C ; Hartschuh, Achim. / Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy. In: ACS Nano. 2010 ; Vol. 4, No. 10. pp. 5914-5920.
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