Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder, Mark C. Hersam

Research output: Contribution to conferencePaper

1 Citation (Scopus)
Original languageEnglish
Pages80-82
Number of pages3
Publication statusPublished - Dec 1 2006
Event3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 - Snowbird, UT, United States
Duration: Apr 23 2006Apr 27 2006

Other

Other3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
CountryUnited States
CitySnowbird, UT
Period4/23/064/27/06

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Yoder, N. L., & Hersam, M. C. (2006). Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. 80-82. Paper presented at 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006, Snowbird, UT, United States.