Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder, Mark C Hersam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publication3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
Pages80-82
Number of pages3
Publication statusPublished - 2006
Event3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 - Snowbird, UT, United States
Duration: Apr 23 2006Apr 27 2006

Other

Other3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
CountryUnited States
CitySnowbird, UT
Period4/23/064/27/06

Fingerprint

Molecular electronics
Ultrahigh vacuum
Scanning tunneling microscopy
Silicon

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Yoder, N. L., & Hersam, M. C. (2006). Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. In 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 (pp. 80-82)

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. / Yoder, Nathan L.; Hersam, Mark C.

3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. 2006. p. 80-82.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoder, NL & Hersam, MC 2006, Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. in 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. pp. 80-82, 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006, Snowbird, UT, United States, 4/23/06.
Yoder NL, Hersam MC. Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. In 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. 2006. p. 80-82
Yoder, Nathan L. ; Hersam, Mark C. / Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. 2006. pp. 80-82
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