Pulsed-laser deposition of heteroepitaxial corundum-type ZITO: Cor-In 2 - 2xZn xSn xO 3

Cathleen A. Hoel; D. Bruce Buchholz; Robert P.H. Chang; Kenneth R. Poeppelmeier

doi:10.1016/j.tsf.2011.10.012

Pulsed-laser deposition of heteroepitaxial corundum-type ZITO: Cor-In _{2 - 2x}Zn _xSn _xO ₃

Cathleen A. Hoel, D. Bruce Buchholz, Robert P.H. Chang, Kenneth R. Poeppelmeier

Northwestern University

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Thin films of corundum-type In _{2 - 2x}Zn _xSn _xO ₃ (cor-ZITO) were grown on lattice-matched substrates using pulsed laser deposition. The (001) of the corundum-type film grew heteroepitaxial to the (001) of a LiNbO ₃ substrate with large grains along the in-plane and out-of-plane orientation characterized by glancing incidence X-ray diffraction and four-circle Φ-scans. A film with 34% In (metals basis) exhibited a wide optical gap of 3.9 eV and a modest conductivity of 134 S/cm, which suggests cor-ZITO is a potential low-cost transparent conducting oxide.

Original language	English
Pages (from-to)	2938-2942
Number of pages	5
Journal	Thin Solid Films
Volume	520
Issue number	7
DOIs	https://doi.org/10.1016/j.tsf.2011.10.012
Publication status	Published - Jan 31 2012

Keywords

Corundum
Epitaxial
Lattice matched
Pulsed-laser deposition
Transparent conducting oxide
Zinc indium tin oxide

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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@article{ae7b8d5c7bad4ae592ef25a2d224a6b9,

title = "Pulsed-laser deposition of heteroepitaxial corundum-type ZITO: Cor-In 2 - 2xZn xSn xO 3",

abstract = "Thin films of corundum-type In 2 - 2xZn xSn xO 3 (cor-ZITO) were grown on lattice-matched substrates using pulsed laser deposition. The (001) of the corundum-type film grew heteroepitaxial to the (001) of a LiNbO 3 substrate with large grains along the in-plane and out-of-plane orientation characterized by glancing incidence X-ray diffraction and four-circle Φ-scans. A film with 34% In (metals basis) exhibited a wide optical gap of 3.9 eV and a modest conductivity of 134 S/cm, which suggests cor-ZITO is a potential low-cost transparent conducting oxide.",

keywords = "Corundum, Epitaxial, Lattice matched, Pulsed-laser deposition, Transparent conducting oxide, Zinc indium tin oxide",

author = "Hoel, {Cathleen A.} and Buchholz, {D. Bruce} and Chang, {Robert P.H.} and Poeppelmeier, {Kenneth R.}",

year = "2012",

month = jan,

day = "31",

doi = "10.1016/j.tsf.2011.10.012",

language = "English",

volume = "520",

pages = "2938--2942",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "7",

}

TY - JOUR

T1 - Pulsed-laser deposition of heteroepitaxial corundum-type ZITO

T2 - Cor-In 2 - 2xZn xSn xO 3

AU - Hoel, Cathleen A.

AU - Buchholz, D. Bruce

AU - Chang, Robert P.H.

AU - Poeppelmeier, Kenneth R.

PY - 2012/1/31

Y1 - 2012/1/31

N2 - Thin films of corundum-type In 2 - 2xZn xSn xO 3 (cor-ZITO) were grown on lattice-matched substrates using pulsed laser deposition. The (001) of the corundum-type film grew heteroepitaxial to the (001) of a LiNbO 3 substrate with large grains along the in-plane and out-of-plane orientation characterized by glancing incidence X-ray diffraction and four-circle Φ-scans. A film with 34% In (metals basis) exhibited a wide optical gap of 3.9 eV and a modest conductivity of 134 S/cm, which suggests cor-ZITO is a potential low-cost transparent conducting oxide.

AB - Thin films of corundum-type In 2 - 2xZn xSn xO 3 (cor-ZITO) were grown on lattice-matched substrates using pulsed laser deposition. The (001) of the corundum-type film grew heteroepitaxial to the (001) of a LiNbO 3 substrate with large grains along the in-plane and out-of-plane orientation characterized by glancing incidence X-ray diffraction and four-circle Φ-scans. A film with 34% In (metals basis) exhibited a wide optical gap of 3.9 eV and a modest conductivity of 134 S/cm, which suggests cor-ZITO is a potential low-cost transparent conducting oxide.

KW - Corundum

KW - Epitaxial

KW - Lattice matched

KW - Pulsed-laser deposition

KW - Transparent conducting oxide

KW - Zinc indium tin oxide

UR - http://www.scopus.com/inward/record.url?scp=84856407240&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84856407240&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2011.10.012

DO - 10.1016/j.tsf.2011.10.012

M3 - Article

AN - SCOPUS:84856407240

VL - 520

SP - 2938

EP - 2942

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 7

ER -