Pyroelectric measurement of surface layer: The case of thin film on dielectric substrate

D. Ehre, E. Mirzadeh, O. Stafsudd, Igor Lubomirsky

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.

Original languageEnglish
Pages (from-to)41-49
Number of pages9
JournalFerroelectrics
Volume472
Issue number1
DOIs
Publication statusPublished - Jan 1 2014

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surface layers
Thin films
Substrates
coefficients
thin films
film thickness
estimates
products
temperature
Temperature

Keywords

  • Pyroelectric effect
  • surface pyroelectricity
  • thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Pyroelectric measurement of surface layer : The case of thin film on dielectric substrate. / Ehre, D.; Mirzadeh, E.; Stafsudd, O.; Lubomirsky, Igor.

In: Ferroelectrics, Vol. 472, No. 1, 01.01.2014, p. 41-49.

Research output: Contribution to journalArticle

Ehre, D. ; Mirzadeh, E. ; Stafsudd, O. ; Lubomirsky, Igor. / Pyroelectric measurement of surface layer : The case of thin film on dielectric substrate. In: Ferroelectrics. 2014 ; Vol. 472, No. 1. pp. 41-49.
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