Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films

Vera Lyahovitskaya, Ilya Zon, Yishay Feldman, Sidney R. Cohen, Alexander K. Tagantsev, Igor Lubomirsky

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)


The magnitude of pyroelectricity in highly stressed quasi-amorphous thin films was analyzed. The amorphous BaTiO3 layers were deposited by radio frequency (RF) magnetron oxygen plasma sputtering. The stress in the BaTiO3 films was measured by the substrate curvature method. It was found that the films that passed through the temperature gradient showed large pyroelectric effect over the temperature range of 20-150 °C.

Original languageEnglish
Pages (from-to)1826-1828
Number of pages3
JournalAdvanced Materials
Issue number21
Publication statusPublished - Nov 4 2003

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films'. Together they form a unique fingerprint.

Cite this