Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films

Vera Lyahovitskaya, Ilya Zon, Yishay Feldman, Sidney R. Cohen, Alexander K. Tagantsev, Igor Lubomirsky

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

The magnitude of pyroelectricity in highly stressed quasi-amorphous thin films was analyzed. The amorphous BaTiO3 layers were deposited by radio frequency (RF) magnetron oxygen plasma sputtering. The stress in the BaTiO3 films was measured by the substrate curvature method. It was found that the films that passed through the temperature gradient showed large pyroelectric effect over the temperature range of 20-150 °C.

Original languageEnglish
Pages (from-to)1826-1828
Number of pages3
JournalAdvanced Materials
Volume15
Issue number21
DOIs
Publication statusPublished - Nov 4 2003

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Pyroelectricity
Amorphous films
Thin films
Thermal gradients
Sputtering
Oxygen
Plasmas
Substrates
Temperature

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Lyahovitskaya, V., Zon, I., Feldman, Y., Cohen, S. R., Tagantsev, A. K., & Lubomirsky, I. (2003). Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films. Advanced Materials, 15(21), 1826-1828. https://doi.org/10.1002/adma.200305346

Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films. / Lyahovitskaya, Vera; Zon, Ilya; Feldman, Yishay; Cohen, Sidney R.; Tagantsev, Alexander K.; Lubomirsky, Igor.

In: Advanced Materials, Vol. 15, No. 21, 04.11.2003, p. 1826-1828.

Research output: Contribution to journalArticle

Lyahovitskaya, V, Zon, I, Feldman, Y, Cohen, SR, Tagantsev, AK & Lubomirsky, I 2003, 'Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films', Advanced Materials, vol. 15, no. 21, pp. 1826-1828. https://doi.org/10.1002/adma.200305346
Lyahovitskaya V, Zon I, Feldman Y, Cohen SR, Tagantsev AK, Lubomirsky I. Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films. Advanced Materials. 2003 Nov 4;15(21):1826-1828. https://doi.org/10.1002/adma.200305346
Lyahovitskaya, Vera ; Zon, Ilya ; Feldman, Yishay ; Cohen, Sidney R. ; Tagantsev, Alexander K. ; Lubomirsky, Igor. / Pyroelectricity in Highly Stressed Quasi-Amorphous Thin Films. In: Advanced Materials. 2003 ; Vol. 15, No. 21. pp. 1826-1828.
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