Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov, Oleg A. Kuznetsov, Avetik R. Harutyunyan, Alexander A. Green, Mark C Hersam, Daniel E. Resasco, Pavel N. Nikolaev, R. Bruce Weisman

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54 Citations (Scopus)

Abstract

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

Original languageEnglish
Pages (from-to)3203-3208
Number of pages6
JournalNano Letters
Volume9
Issue number9
DOIs
Publication statusPublished - Sep 9 2009

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ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

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