Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov, Oleg A. Kuznetsov, Avetik R. Harutyunyan, Alexander A. Green, Mark C Hersam, Daniel E. Resasco, Pavel N. Nikolaev, R. Bruce Weisman

Research output: Contribution to journalArticle

54 Citations (Scopus)

Abstract

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

Original languageEnglish
Pages (from-to)3203-3208
Number of pages6
JournalNano Letters
Volume9
Issue number9
DOIs
Publication statusPublished - Sep 9 2009

Fingerprint

Single-walled carbon nanotubes (SWCN)
Photoluminescence
Microscopic examination
carbon nanotubes
microscopy
photoluminescence
classifying
Sorting
Nanotubes
nanotubes
counting
atomic force microscopy
gradients
Chemical analysis

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

Cite this

Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies. / Naumov, Anton V.; Kuznetsov, Oleg A.; Harutyunyan, Avetik R.; Green, Alexander A.; Hersam, Mark C; Resasco, Daniel E.; Nikolaev, Pavel N.; Weisman, R. Bruce.

In: Nano Letters, Vol. 9, No. 9, 09.09.2009, p. 3203-3208.

Research output: Contribution to journalArticle

Naumov, AV, Kuznetsov, OA, Harutyunyan, AR, Green, AA, Hersam, MC, Resasco, DE, Nikolaev, PN & Weisman, RB 2009, 'Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies', Nano Letters, vol. 9, no. 9, pp. 3203-3208. https://doi.org/10.1021/nl9014342
Naumov, Anton V. ; Kuznetsov, Oleg A. ; Harutyunyan, Avetik R. ; Green, Alexander A. ; Hersam, Mark C ; Resasco, Daniel E. ; Nikolaev, Pavel N. ; Weisman, R. Bruce. / Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies. In: Nano Letters. 2009 ; Vol. 9, No. 9. pp. 3203-3208.
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