TY - JOUR
T1 - Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes
AU - Abeykoon, Milinda
AU - Malliakas, Christos D.
AU - Juhás, Pavol
AU - Božin, Emil S.
AU - Kanatzidis, Mercouri G.
AU - Billinge, Simon J.L.
N1 - Funding Information:
access to the X7B beamline at NSLS, which is supported by DOE-BES under contract No DE-AC02-98CH10886. Work in the Billinge group was supported by DOE-BES through account DE-AC02-98CH10886. Work in the Kanatzidis group was supported by NSF through grant DMR-1104965.
Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.
PY - 2012/5
Y1 - 2012/5
N2 - Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.
AB - Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.
KW - Electron diffraction
KW - Nanomaterials
KW - Pair distribution function
KW - Polycrystalline films
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U2 - 10.1524/zkri.2012.1510
DO - 10.1524/zkri.2012.1510
M3 - Article
AN - SCOPUS:84864979857
VL - 227
SP - 248
EP - 256
JO - Zeitschfrift fur Kristallographie
JF - Zeitschfrift fur Kristallographie
SN - 0044-2968
IS - 5
ER -