Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

Milinda Abeykoon, Christos D. Malliakas, Pavol Juhás, Emil S. Božin, Mercouri G Kanatzidis, Simon J L Billinge

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

Original languageEnglish
Pages (from-to)248-256
Number of pages9
JournalZeitschrift fur Kristallographie
Volume227
Issue number5
DOIs
Publication statusPublished - May 2012

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Nanostructured materials
Distribution functions
Nanostructures
Electron microscopes
electron microscopes
distribution functions
Electrons
attachment
Microscopes
electrons
microscopes
methodology
chemistry
Transmission electron microscopy
filters
transmission electron microscopy
energy

Keywords

  • Electron diffraction
  • Nanomaterials
  • Pair distribution function
  • Polycrystalline films

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Science(all)

Cite this

Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes. / Abeykoon, Milinda; Malliakas, Christos D.; Juhás, Pavol; Božin, Emil S.; Kanatzidis, Mercouri G; Billinge, Simon J L.

In: Zeitschrift fur Kristallographie, Vol. 227, No. 5, 05.2012, p. 248-256.

Research output: Contribution to journalArticle

Abeykoon, Milinda ; Malliakas, Christos D. ; Juhás, Pavol ; Božin, Emil S. ; Kanatzidis, Mercouri G ; Billinge, Simon J L. / Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes. In: Zeitschrift fur Kristallographie. 2012 ; Vol. 227, No. 5. pp. 248-256.
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