Abstract
Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.
| Original language | English |
|---|---|
| Pages (from-to) | 248-256 |
| Number of pages | 9 |
| Journal | Zeitschrift fur Kristallographie |
| Volume | 227 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 1 2012 |
Keywords
- Electron diffraction
- Nanomaterials
- Pair distribution function
- Polycrystalline films
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Inorganic Chemistry
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Abeykoon, M., Malliakas, C. D., Juhás, P., Božin, E. S., Kanatzidis, M. G., & Billinge, S. J. L. (2012). Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes. Zeitschrift fur Kristallographie, 227(5), 248-256. https://doi.org/10.1524/zkri.2012.1510