Quantum image scanning microscopy: Concept and considerations towards applicability

Ron Tenne, Uri Rossman, Batel Rephael, Yonatan Israel, Alexander Krupinski-Ptaszek, Radek Lapkiewicz, Yaron Silberberg, Dan Oron

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Technological advancements in the creation, manipulation and detection of quantum states of light have motivated the application of such states to overcome classical limits in sensing and imaging. In particular, there has been a surge of recent interest in super-resolution imaging based on principles of quantum optics. However, the application of such schemes for practical imaging of biological samples is demanding in terms of signal-to-noise ratio, speed of acquisition and robustness with respect to sample labeling. Here, we re-introduce the concept of quantum image scanning microscopy (Q-ISM), a super-resolution method that enhances the classical image scanning microscopy (ISM) method by measuring photon correlations. Q-ISM was already utilized to achieve super-resolved images of a biological sample labeled with fluorescent nanoscrystals whose contrast is based entirely on a quantum optical phenomenon, photon antibunching. We present here an experimental demonstration of the method and discuss with further details its prospects for application in life science microscopy.

Original languageEnglish
Title of host publicationOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
EditorsSelim M. Shahriar, Jacob Scheuer
PublisherSPIE
ISBN (Electronic)9781510625105
DOIs
Publication statusPublished - Jan 1 2019
EventOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019 - San Francisco, United States
Duration: Feb 2 2019Feb 7 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10934
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology 2019
CountryUnited States
CitySan Francisco
Period2/2/192/7/19

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Keywords

  • Image scanning microscopy
  • Photon antibunching
  • Quantum imaging
  • Super-resolution microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Tenne, R., Rossman, U., Rephael, B., Israel, Y., Krupinski-Ptaszek, A., Lapkiewicz, R., Silberberg, Y., & Oron, D. (2019). Quantum image scanning microscopy: Concept and considerations towards applicability. In S. M. Shahriar, & J. Scheuer (Eds.), Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology [109341P] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10934). SPIE. https://doi.org/10.1117/12.2514459