Abstract
Increasingly complex demonstrations of integrated circuit elements based on semiconducting single-walled carbon nanotubes (SWCNTs) mark the maturation of this technology for use in next-generation electronics. In particular, organic materials have recently been leveraged as dopant and encapsulation layers to enable stable SWCNT-based rail-to-rail, low-power complementary metal-oxide-semiconductor (CMOS) logic circuits. To explore the limits of this technology in extreme environments, here we study total ionizing dose (TID) effects in enhancement-mode SWCNT-CMOS inverters that employ organic doping and encapsulation layers. Details of the evolution of the device transport properties are revealed by in situ and in operando measurements, identifying n-type transistors as the more TID-sensitive component of the CMOS system with over an order of magnitude larger degradation of the static power dissipation. To further improve device stability, radiation-hardening approaches are explored, resulting in the observation that SWNCT-CMOS circuits are TID-hard under dynamic bias operation. Overall, this work reveals conditions under which SWCNTs can be employed for radiation-hard integrated circuits, thus presenting significant potential for next-generation satellite and space applications.
| Original language | English |
|---|---|
| Pages (from-to) | 2992-3000 |
| Number of pages | 9 |
| Journal | ACS Nano |
| Volume | 11 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Mar 28 2017 |
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Keywords
- CMOS
- hardening
- inverter
- radiation
- SWCNT
- total ionizing dose
ASJC Scopus subject areas
- Materials Science(all)
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Radiation-Hard Complementary Integrated Circuits Based on Semiconducting Single-Walled Carbon Nanotubes. / McMorrow, Julian J.; Cress, Cory D.; Gaviria Rojas, William A.; Geier, Michael L.; Marks, Tobin J; Hersam, Mark C.
In: ACS Nano, Vol. 11, No. 3, 28.03.2017, p. 2992-3000.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Radiation-Hard Complementary Integrated Circuits Based on Semiconducting Single-Walled Carbon Nanotubes
AU - McMorrow, Julian J.
AU - Cress, Cory D.
AU - Gaviria Rojas, William A.
AU - Geier, Michael L.
AU - Marks, Tobin J
AU - Hersam, Mark C
PY - 2017/3/28
Y1 - 2017/3/28
N2 - Increasingly complex demonstrations of integrated circuit elements based on semiconducting single-walled carbon nanotubes (SWCNTs) mark the maturation of this technology for use in next-generation electronics. In particular, organic materials have recently been leveraged as dopant and encapsulation layers to enable stable SWCNT-based rail-to-rail, low-power complementary metal-oxide-semiconductor (CMOS) logic circuits. To explore the limits of this technology in extreme environments, here we study total ionizing dose (TID) effects in enhancement-mode SWCNT-CMOS inverters that employ organic doping and encapsulation layers. Details of the evolution of the device transport properties are revealed by in situ and in operando measurements, identifying n-type transistors as the more TID-sensitive component of the CMOS system with over an order of magnitude larger degradation of the static power dissipation. To further improve device stability, radiation-hardening approaches are explored, resulting in the observation that SWNCT-CMOS circuits are TID-hard under dynamic bias operation. Overall, this work reveals conditions under which SWCNTs can be employed for radiation-hard integrated circuits, thus presenting significant potential for next-generation satellite and space applications.
AB - Increasingly complex demonstrations of integrated circuit elements based on semiconducting single-walled carbon nanotubes (SWCNTs) mark the maturation of this technology for use in next-generation electronics. In particular, organic materials have recently been leveraged as dopant and encapsulation layers to enable stable SWCNT-based rail-to-rail, low-power complementary metal-oxide-semiconductor (CMOS) logic circuits. To explore the limits of this technology in extreme environments, here we study total ionizing dose (TID) effects in enhancement-mode SWCNT-CMOS inverters that employ organic doping and encapsulation layers. Details of the evolution of the device transport properties are revealed by in situ and in operando measurements, identifying n-type transistors as the more TID-sensitive component of the CMOS system with over an order of magnitude larger degradation of the static power dissipation. To further improve device stability, radiation-hardening approaches are explored, resulting in the observation that SWNCT-CMOS circuits are TID-hard under dynamic bias operation. Overall, this work reveals conditions under which SWCNTs can be employed for radiation-hard integrated circuits, thus presenting significant potential for next-generation satellite and space applications.
KW - CMOS
KW - hardening
KW - inverter
KW - radiation
KW - SWCNT
KW - total ionizing dose
UR - http://www.scopus.com/inward/record.url?scp=85016440046&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85016440046&partnerID=8YFLogxK
U2 - 10.1021/acsnano.6b08561
DO - 10.1021/acsnano.6b08561
M3 - Article
C2 - 28212000
AN - SCOPUS:85016440046
VL - 11
SP - 2992
EP - 3000
JO - ACS Nano
JF - ACS Nano
SN - 1936-0851
IS - 3
ER -