Radiation induced charge trapping in ultrathin HfO 2-based MOSFETs

Sriram K. Dixit, Xing J. Zhou, Ronald D. Schrimpf, Daniel M. Fleetwood, Sokrates T. Pantelides, Rino Choi, Gennadi Bersuker, Leonard C. Feldman

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60 Citations (Scopus)

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