A low-energy electron diffraction (LEED) instrument has been constructed which allows one to visually observe a LEED pattern, record the pattern, record the pattern photographically and obtain immediate, quantitative intensity data from several diffraction beams in 5-10 s. The instrument operates at incident beam currents of a few picoamperes eliminating electron beam damage effects. Design and construction of this new LEED instrument are described. The paper reports on the operating parameters of sensitivity, signal-to-noise, image distortion, and angular resolution.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)