Relating local electric field in a ferroelectric capacitor to externally measurable voltages

Francis K. Chai, J. R. Brews, R. D. Schrimpf, Dunbar P Birnie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The field-dependent polarization model is a commonly proposed model to describe the hysteresis loop of a ferroelectric material. The electric field in the model refers to the local field which varies with position within the ferroelectric film. However, the parameters in the field-dependent polarization are usually extracted based on the macroscopic experimentally averaged field, i.e., applied voltage divided by film thickness. In this work physical quantities such as field, potential, electric displacement and polarization inside the ferroelectric capacitor are obtained by assuming that the capacitor is wholly depleted. The resultant electric field distribution demonstrates the significant difference between the local electric field and the macroscopic average field, indicates that extension of some modeling works is necessary. For the assumption of complete depletion to be valid, a constraint is required upon the film thickness at a given value of doping. A design curve is constructed that shows the maximum allowable film thickness for typical PZT film doping levels in order for the assumption of complete depletion to be valid. The technique presented in this work provides a simple and direct way of relating the macroscopic properties of the capacitor to the actual electric field and potential distribution in the ferroelectric film, furthermore, it will serve as a basis for the C-V modeling of ferroelectric capacitors.

Original languageEnglish
Title of host publicationIEEE International Symposium on Applications of Ferroelectrics
Editors Anon
PublisherIEEE
Pages83-86
Number of pages4
Publication statusPublished - 1994
EventProceedings of the 1994 9th IEEE International Symposium on Applications of Ferroelectrics - University Park, PA, USA
Duration: Aug 7 1994Aug 10 1994

Other

OtherProceedings of the 1994 9th IEEE International Symposium on Applications of Ferroelectrics
CityUniversity Park, PA, USA
Period8/7/948/10/94

Fingerprint

Ferroelectric materials
Capacitors
Electric fields
Ferroelectric films
Film thickness
Electric potential
Polarization
Doping (additives)
Hysteresis loops

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)

Cite this

Chai, F. K., Brews, J. R., Schrimpf, R. D., & Birnie, D. P. (1994). Relating local electric field in a ferroelectric capacitor to externally measurable voltages. In Anon (Ed.), IEEE International Symposium on Applications of Ferroelectrics (pp. 83-86). IEEE.

Relating local electric field in a ferroelectric capacitor to externally measurable voltages. / Chai, Francis K.; Brews, J. R.; Schrimpf, R. D.; Birnie, Dunbar P.

IEEE International Symposium on Applications of Ferroelectrics. ed. / Anon. IEEE, 1994. p. 83-86.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chai, FK, Brews, JR, Schrimpf, RD & Birnie, DP 1994, Relating local electric field in a ferroelectric capacitor to externally measurable voltages. in Anon (ed.), IEEE International Symposium on Applications of Ferroelectrics. IEEE, pp. 83-86, Proceedings of the 1994 9th IEEE International Symposium on Applications of Ferroelectrics, University Park, PA, USA, 8/7/94.
Chai FK, Brews JR, Schrimpf RD, Birnie DP. Relating local electric field in a ferroelectric capacitor to externally measurable voltages. In Anon, editor, IEEE International Symposium on Applications of Ferroelectrics. IEEE. 1994. p. 83-86
Chai, Francis K. ; Brews, J. R. ; Schrimpf, R. D. ; Birnie, Dunbar P. / Relating local electric field in a ferroelectric capacitor to externally measurable voltages. IEEE International Symposium on Applications of Ferroelectrics. editor / Anon. IEEE, 1994. pp. 83-86
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