Relationships among resonant frequency changes on a coated quartz crystal microbalance, thickness changes, and resistance responses of polymer-carbon black composite chemiresistors

Erik J. Severin, Nathan S Lewis

Research output: Contribution to journalArticle

89 Citations (Scopus)

Abstract

The relationships among frequency changes on a film-coated quartz crystal microbalance, thickness changes, and dc resistance changes have been investigated for carbon black-insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneously on polymer films that do not contain carbon black filler to relate the QCM frequency change and the ellipsometrically determined thickness change to the analyte concentration in the vapor phase. In addition, quartz crystal microbalance measurements and dc resistance measurements on carbon black composites of these same polymers have been performed simultaneously to relate the QCM frequency change and dc electrical resistance response to the analyte concentration in the vapor phase. The data indicate that the dc resistance change is directly relatable to the thickness change of the polymers and that a variety of analytes that produce a given thickness change produce a constant resistance change for each member of the test set of polymers investigated in this work.

Original languageEnglish
Pages (from-to)2008-2015
Number of pages8
JournalAnalytical Chemistry
Volume72
Issue number9
Publication statusPublished - May 1 2000

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Soot
Quartz crystal microbalances
Natural frequencies
Polymers
Composite materials
Vapors
Acoustic impedance
Ellipsometry
Polymer films
Fillers
Detectors

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

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abstract = "The relationships among frequency changes on a film-coated quartz crystal microbalance, thickness changes, and dc resistance changes have been investigated for carbon black-insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneously on polymer films that do not contain carbon black filler to relate the QCM frequency change and the ellipsometrically determined thickness change to the analyte concentration in the vapor phase. In addition, quartz crystal microbalance measurements and dc resistance measurements on carbon black composites of these same polymers have been performed simultaneously to relate the QCM frequency change and dc electrical resistance response to the analyte concentration in the vapor phase. The data indicate that the dc resistance change is directly relatable to the thickness change of the polymers and that a variety of analytes that produce a given thickness change produce a constant resistance change for each member of the test set of polymers investigated in this work.",
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AB - The relationships among frequency changes on a film-coated quartz crystal microbalance, thickness changes, and dc resistance changes have been investigated for carbon black-insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneously on polymer films that do not contain carbon black filler to relate the QCM frequency change and the ellipsometrically determined thickness change to the analyte concentration in the vapor phase. In addition, quartz crystal microbalance measurements and dc resistance measurements on carbon black composites of these same polymers have been performed simultaneously to relate the QCM frequency change and dc electrical resistance response to the analyte concentration in the vapor phase. The data indicate that the dc resistance change is directly relatable to the thickness change of the polymers and that a variety of analytes that produce a given thickness change produce a constant resistance change for each member of the test set of polymers investigated in this work.

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