Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies

Christopher Fockenberg, Herbert J. Bernstein, Gregory E. Hall, James Muckerman, Jack M. Preses, Trevor J. Sears, Ralph E. Weston

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

An apparatus has been constructed to study radical-radical reactions in the gas phase. It consists of a tubular quartz reactor in which radicals are produced by flash photolysis using an excimer laser as light source. The composition of the gas mixture is analyzed in situ by photoionizing sampled gases using the vacuum ultraviolet emission of a hollow cathode lamp and subsequent time-of-flight mass spectrometry. A simple arrangement of grids at the entrance to the flight tube is used to interrupt the constant flux of ions by application of a combination of constant and pulsed voltages. Individual mass spectra can be taken at a repetition rate of around 20 kHz following each photolysis event. Signal counts from a specified number of consecutive mass spectra are fed into a 2 GHz multiscaler and accumulated as a sampling-time-indexed series of mass spectra. This allows simultaneous observation of the concentrations of multiple transient or stable species on a millisecond time scale. To achieve a suitable signal-to-noise ratio, signals were typically accumulated over several tens of thousands of laser shots at a pulse rate of 10-15 Hz.

Original languageEnglish
Pages (from-to)3259-3264
Number of pages6
JournalReview of Scientific Instruments
Volume70
Issue number8
Publication statusPublished - Aug 1999

Fingerprint

Photolysis
mass spectra
Mass spectrometry
mass spectroscopy
vapor phases
Kinetics
photolysis
kinetics
Excimer lasers
Electric lamps
Gases
Gas mixtures
pulse rate
Light sources
Quartz
Time series
Laser pulses
Signal to noise ratio
Cathodes
ultraviolet emission

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Fockenberg, C., Bernstein, H. J., Hall, G. E., Muckerman, J., Preses, J. M., Sears, T. J., & Weston, R. E. (1999). Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies. Review of Scientific Instruments, 70(8), 3259-3264.

Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies. / Fockenberg, Christopher; Bernstein, Herbert J.; Hall, Gregory E.; Muckerman, James; Preses, Jack M.; Sears, Trevor J.; Weston, Ralph E.

In: Review of Scientific Instruments, Vol. 70, No. 8, 08.1999, p. 3259-3264.

Research output: Contribution to journalArticle

Fockenberg, C, Bernstein, HJ, Hall, GE, Muckerman, J, Preses, JM, Sears, TJ & Weston, RE 1999, 'Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies', Review of Scientific Instruments, vol. 70, no. 8, pp. 3259-3264.
Fockenberg C, Bernstein HJ, Hall GE, Muckerman J, Preses JM, Sears TJ et al. Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies. Review of Scientific Instruments. 1999 Aug;70(8):3259-3264.
Fockenberg, Christopher ; Bernstein, Herbert J. ; Hall, Gregory E. ; Muckerman, James ; Preses, Jack M. ; Sears, Trevor J. ; Weston, Ralph E. / Repetitively sampled time-of-flight mass spectrometry for gas-phase kinetics studies. In: Review of Scientific Instruments. 1999 ; Vol. 70, No. 8. pp. 3259-3264.
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