Room temperature phase transition in CeO2 nanocrystalline films

Anna Kossoy, Jaya P. Nair, Ellen Wachtel, Igor Lubomirsky, Juergen Fleig, Joachim Maier

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The temporal evolution of the lattice parameter of oxygen deficient nanocrystalline cerium oxide films was monitored by X-ray diffraction. It was found that films with lattice parameter of ≈ 5.47 {Å} upon deposition undergo large spontaneous expansion, in which the size of the unit cell increases by ≈ 0.7% during the course of days. The films with as-deposited lattice parameter larger or smaller than ≈ 5.47 Å do not show significant changes. This behavior is consistent with the previously suggested hypothesis of an order-disorder transition of oxygen vacancies and can be viewed as its direct experimental confirmation.

Original languageEnglish
Pages (from-to)605-608
Number of pages4
JournalJournal of Electroceramics
Volume13
Issue number1-3
DOIs
Publication statusPublished - Jul 2004

Fingerprint

Lattice constants
lattice parameters
Phase transitions
room temperature
cerium oxides
Order disorder transitions
oxygen
Oxygen vacancies
Cerium
Temperature
Oxide films
oxide films
disorders
Oxygen
X ray diffraction
expansion
cells
diffraction
x rays
ceric oxide

Keywords

  • Cerium oxide
  • Diffusion
  • Mechanical stress
  • Nanocrystalline ceramics

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

Room temperature phase transition in CeO2 nanocrystalline films. / Kossoy, Anna; Nair, Jaya P.; Wachtel, Ellen; Lubomirsky, Igor; Fleig, Juergen; Maier, Joachim.

In: Journal of Electroceramics, Vol. 13, No. 1-3, 07.2004, p. 605-608.

Research output: Contribution to journalArticle

Kossoy, Anna ; Nair, Jaya P. ; Wachtel, Ellen ; Lubomirsky, Igor ; Fleig, Juergen ; Maier, Joachim. / Room temperature phase transition in CeO2 nanocrystalline films. In: Journal of Electroceramics. 2004 ; Vol. 13, No. 1-3. pp. 605-608.
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