Scaling analysis of Schottky barriers at metal-embedded semiconducting carbon nanotube interfaces

Yongqiang Xue, Mark A Ratner

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

We present an atomistic self-consistent tight-binding study of the electronic and transport properties of metal-semiconducting carbon nanotube interfaces as a function of the nanotube channel length when the end of the nanotube wire is buried inside the electrodes. We show that the lineup of the nanotube band structure relative to the metal Fermi level depends strongly on the metal work function but weakly on the details of the interface. We analyze the length-dependent transport characteristics, which predicts a transition from tunneling to thermally activated transport with increasing nanotube channel length.

Original languageEnglish
Article number161402
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number16
DOIs
Publication statusPublished - Apr 2004

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Carbon Nanotubes
Nanotubes
Carbon nanotubes
nanotubes
Metals
carbon nanotubes
scaling
metals
Fermi level
Electronic properties
Band structure
Transport properties
transport properties
wire
Wire
Electrodes
electrodes
electronics

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

@article{c53eb8bac88541e0afa8615ecbb1198f,
title = "Scaling analysis of Schottky barriers at metal-embedded semiconducting carbon nanotube interfaces",
abstract = "We present an atomistic self-consistent tight-binding study of the electronic and transport properties of metal-semiconducting carbon nanotube interfaces as a function of the nanotube channel length when the end of the nanotube wire is buried inside the electrodes. We show that the lineup of the nanotube band structure relative to the metal Fermi level depends strongly on the metal work function but weakly on the details of the interface. We analyze the length-dependent transport characteristics, which predicts a transition from tunneling to thermally activated transport with increasing nanotube channel length.",
author = "Yongqiang Xue and Ratner, {Mark A}",
year = "2004",
month = "4",
doi = "10.1103/PhysRevB.69.161402",
language = "English",
volume = "69",
journal = "Physical Review B-Condensed Matter",
issn = "1098-0121",
publisher = "American Physical Society",
number = "16",

}

TY - JOUR

T1 - Scaling analysis of Schottky barriers at metal-embedded semiconducting carbon nanotube interfaces

AU - Xue, Yongqiang

AU - Ratner, Mark A

PY - 2004/4

Y1 - 2004/4

N2 - We present an atomistic self-consistent tight-binding study of the electronic and transport properties of metal-semiconducting carbon nanotube interfaces as a function of the nanotube channel length when the end of the nanotube wire is buried inside the electrodes. We show that the lineup of the nanotube band structure relative to the metal Fermi level depends strongly on the metal work function but weakly on the details of the interface. We analyze the length-dependent transport characteristics, which predicts a transition from tunneling to thermally activated transport with increasing nanotube channel length.

AB - We present an atomistic self-consistent tight-binding study of the electronic and transport properties of metal-semiconducting carbon nanotube interfaces as a function of the nanotube channel length when the end of the nanotube wire is buried inside the electrodes. We show that the lineup of the nanotube band structure relative to the metal Fermi level depends strongly on the metal work function but weakly on the details of the interface. We analyze the length-dependent transport characteristics, which predicts a transition from tunneling to thermally activated transport with increasing nanotube channel length.

UR - http://www.scopus.com/inward/record.url?scp=42749104266&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=42749104266&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.69.161402

DO - 10.1103/PhysRevB.69.161402

M3 - Article

AN - SCOPUS:42749104266

VL - 69

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 1098-0121

IS - 16

M1 - 161402

ER -