Scanning force microscopy investigation of surface forces at the tungsten oxide/lithium borate interface

D. A. Hensley, Steve Garofalini

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Ultrahigh-vacuum scanning force microscopy (UHV SFM) was used to measure force-distance (FD) interactions between electrochemically etched clean and oxidized tungsten tips and an in situ deposited lithium borate film. For the case of the oxidized tip, application of a potential difference between the tip and sample allowed lithium to be cycled into and back out of the oxide layer in the tungsten tip. Reproducible changes in the shape and magnitude of the force-distance interaction were observed.

Original languageEnglish
Pages (from-to)669-675
Number of pages7
JournalJournal of the Electrochemical Society
Volume145
Issue number2
Publication statusPublished - Feb 1998

Fingerprint

lithium borates
Tungsten
tungsten oxides
Atomic force microscopy
Lithium
microscopy
Oxides
scanning
Ultrahigh vacuum
tungsten
ultrahigh vacuum
lithium
interactions
oxides
tungsten oxide
lithium borate
Borates

ASJC Scopus subject areas

  • Electrochemistry
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Scanning force microscopy investigation of surface forces at the tungsten oxide/lithium borate interface. / Hensley, D. A.; Garofalini, Steve.

In: Journal of the Electrochemical Society, Vol. 145, No. 2, 02.1998, p. 669-675.

Research output: Contribution to journalArticle

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