Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus

Xiaolong Liu, Kan Sheng Chen, Spencer A. Wells, Itamar Balla, Jian Zhu, Joshua D. Wood, Mark C Hersam

Research output: Contribution to journalArticle

21 Citations (Scopus)
Original languageEnglish
Article number1604121
JournalAdvanced Materials
Volume29
Issue number1
DOIs
Publication statusPublished - Jan 4 2017

Fingerprint

Nanolithography
Organic polymers
Secondary ion mass spectrometry
Phosphorus
Mass spectrometry
Byproducts
Atomic force microscopy
Transistors
Scanning
Keto Acids
Anodic oxidation
Silicon
Raman spectroscopy
Liquids

Keywords

  • 2D
  • conductive atomic force microscopy
  • nanolithography
  • phosphorene
  • phosphorus oxide
  • transistors

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus. / Liu, Xiaolong; Chen, Kan Sheng; Wells, Spencer A.; Balla, Itamar; Zhu, Jian; Wood, Joshua D.; Hersam, Mark C.

In: Advanced Materials, Vol. 29, No. 1, 1604121, 04.01.2017.

Research output: Contribution to journalArticle

Liu, Xiaolong ; Chen, Kan Sheng ; Wells, Spencer A. ; Balla, Itamar ; Zhu, Jian ; Wood, Joshua D. ; Hersam, Mark C. / Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus. In: Advanced Materials. 2017 ; Vol. 29, No. 1.
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