Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2

H. Bengel, S. Jobic, C. Deudon, J. Rouxel, Dong Kyun Seo, M. H. Whangbo

Research output: Contribution to journalArticle

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Abstract

The misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2 were examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these compounds the NaCl-type double MS (M = La, Pb, Sb) layers (Q layers) alternate with the NbS2 layers (H layers) made up of NbS6 trigonal prisms. It was possible to record AFM and STM images for only the H layers for (LaS)1.14(NbS2)n, but for both the H and Q layers for [(Pb,Sb)S]1.14NbS2. Partial and total electron density plots of the H and Q layers were calculated to interpret the observed STM and AFM images. The bright spots in the STM and AFM images of the H layer correspond to S atoms, and those of the Q layer to Pb and Sb atoms. The STM images for the Q layers of [(Pb,Sb)S]1.14NbS2 suggest that a short-range ordering of the Pb and Sb atoms occurs in the (Pb,Sb)S sheets of the Q layer.

Original languageEnglish
Pages (from-to)266-276
Number of pages11
JournalSurface Science
Volume400
Issue number1-3
Publication statusPublished - Mar 12 1998

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Scanning tunneling microscopy
Atomic force microscopy
atomic force microscopy
Scanning
scanning
Atoms
scanning tunneling microscopy
Prisms
Carrier concentration
atoms
prisms
plots

Keywords

  • Atomic force microscopy
  • Image simulations
  • Misfit layered compounds
  • Scanning tunneling microscopy
  • Sulphides
  • Surface defects
  • Surface structure, morphology, roughness, and topography

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2. / Bengel, H.; Jobic, S.; Deudon, C.; Rouxel, J.; Seo, Dong Kyun; Whangbo, M. H.

In: Surface Science, Vol. 400, No. 1-3, 12.03.1998, p. 266-276.

Research output: Contribution to journalArticle

Bengel, H. ; Jobic, S. ; Deudon, C. ; Rouxel, J. ; Seo, Dong Kyun ; Whangbo, M. H. / Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2. In: Surface Science. 1998 ; Vol. 400, No. 1-3. pp. 266-276.
@article{63a8393b16064f8398417c0bcef210c1,
title = "Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2",
abstract = "The misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2 were examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these compounds the NaCl-type double MS (M = La, Pb, Sb) layers (Q layers) alternate with the NbS2 layers (H layers) made up of NbS6 trigonal prisms. It was possible to record AFM and STM images for only the H layers for (LaS)1.14(NbS2)n, but for both the H and Q layers for [(Pb,Sb)S]1.14NbS2. Partial and total electron density plots of the H and Q layers were calculated to interpret the observed STM and AFM images. The bright spots in the STM and AFM images of the H layer correspond to S atoms, and those of the Q layer to Pb and Sb atoms. The STM images for the Q layers of [(Pb,Sb)S]1.14NbS2 suggest that a short-range ordering of the Pb and Sb atoms occurs in the (Pb,Sb)S sheets of the Q layer.",
keywords = "Atomic force microscopy, Image simulations, Misfit layered compounds, Scanning tunneling microscopy, Sulphides, Surface defects, Surface structure, morphology, roughness, and topography",
author = "H. Bengel and S. Jobic and C. Deudon and J. Rouxel and Seo, {Dong Kyun} and Whangbo, {M. H.}",
year = "1998",
month = "3",
day = "12",
language = "English",
volume = "400",
pages = "266--276",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
number = "1-3",

}

TY - JOUR

T1 - Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2

AU - Bengel, H.

AU - Jobic, S.

AU - Deudon, C.

AU - Rouxel, J.

AU - Seo, Dong Kyun

AU - Whangbo, M. H.

PY - 1998/3/12

Y1 - 1998/3/12

N2 - The misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2 were examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these compounds the NaCl-type double MS (M = La, Pb, Sb) layers (Q layers) alternate with the NbS2 layers (H layers) made up of NbS6 trigonal prisms. It was possible to record AFM and STM images for only the H layers for (LaS)1.14(NbS2)n, but for both the H and Q layers for [(Pb,Sb)S]1.14NbS2. Partial and total electron density plots of the H and Q layers were calculated to interpret the observed STM and AFM images. The bright spots in the STM and AFM images of the H layer correspond to S atoms, and those of the Q layer to Pb and Sb atoms. The STM images for the Q layers of [(Pb,Sb)S]1.14NbS2 suggest that a short-range ordering of the Pb and Sb atoms occurs in the (Pb,Sb)S sheets of the Q layer.

AB - The misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2 were examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these compounds the NaCl-type double MS (M = La, Pb, Sb) layers (Q layers) alternate with the NbS2 layers (H layers) made up of NbS6 trigonal prisms. It was possible to record AFM and STM images for only the H layers for (LaS)1.14(NbS2)n, but for both the H and Q layers for [(Pb,Sb)S]1.14NbS2. Partial and total electron density plots of the H and Q layers were calculated to interpret the observed STM and AFM images. The bright spots in the STM and AFM images of the H layer correspond to S atoms, and those of the Q layer to Pb and Sb atoms. The STM images for the Q layers of [(Pb,Sb)S]1.14NbS2 suggest that a short-range ordering of the Pb and Sb atoms occurs in the (Pb,Sb)S sheets of the Q layer.

KW - Atomic force microscopy

KW - Image simulations

KW - Misfit layered compounds

KW - Scanning tunneling microscopy

KW - Sulphides

KW - Surface defects

KW - Surface structure, morphology, roughness, and topography

UR - http://www.scopus.com/inward/record.url?scp=0032022551&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032022551&partnerID=8YFLogxK

M3 - Article

VL - 400

SP - 266

EP - 276

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 1-3

ER -