Schottky barrier height in GaN/Al junctions

An ab-initio study

S. Picozzi, A. Continenza, S. Massidda, Arthur J Freeman

Research output: Contribution to journalArticle

Abstract

We performed ab-initio full-potential linearized augmented plane wave (FLAPW) calculations for [0001]-wurtzite and [111]-zincblende GaN/Al junctions, focusing on the Schottky barrier height. We propose a procedure to evaluate the potential discontinuity in the presence of electric fields, showing that their effect is relatively small (a few tenths of an eV). These calculations assess the rectifying behaviour of the GaN/Al contact, in agreement with experimental values for the barrier.

Original languageEnglish
Pages (from-to)257-262
Number of pages6
JournalPhysica Status Solidi (A) Applied Research
Volume190
Issue number1
DOIs
Publication statusPublished - Mar 2002

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zincblende
wurtzite
discontinuity
plane waves
Electric fields
electric fields

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Schottky barrier height in GaN/Al junctions : An ab-initio study. / Picozzi, S.; Continenza, A.; Massidda, S.; Freeman, Arthur J.

In: Physica Status Solidi (A) Applied Research, Vol. 190, No. 1, 03.2002, p. 257-262.

Research output: Contribution to journalArticle

Picozzi, S. ; Continenza, A. ; Massidda, S. ; Freeman, Arthur J. / Schottky barrier height in GaN/Al junctions : An ab-initio study. In: Physica Status Solidi (A) Applied Research. 2002 ; Vol. 190, No. 1. pp. 257-262.
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