Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

Anton Barty, Carl Caleman, Andrew Aquila, Nicusor Timneanu, Lukas Lomb, Thomas A. White, Jakob Andreasson, David Arnlund, Saša Bajt, Thomas R.M. Barends, Miriam Barthelmess, Michael J. Bogan, Christoph Bostedt, John D. Bozek, Ryan Coffee, Nicola Coppola, Jan Davidsson, Daniel P. Deponte, R. Bruce Doak, Tomas EkebergVeit Elser, Sascha W. Epp, Benjamin Erk, Holger Fleckenstein, Lutz Foucar, Petra Fromme, Heinz Graafsma, Lars Gumprecht, Janos Hajdu, Christina Y. Hampton, Robert Hartmann, Andreas Hartmann, Günter Hauser, Helmut Hirsemann, Peter Holl, Mark S. Hunter, Linda Johansson, Stephan Kassemeyer, Nils Kimmel, Richard A. Kirian, Mengning Liang, Filipe R.N.C. Maia, Erik Malmerberg, Stefano Marchesini, Andrew V. Martin, Karol Nass, Richard Neutze, Christian Reich, Daniel Rolles, Benedikt Rudek, Artem Rudenko, Howard Scott, Ilme Schlichting, Joachim Schulz, M. Marvin Seibert, Robert L. Shoeman, Raymond G. Sierra, Heike Soltau, John C.H. Spence, Francesco Stellato, Stephan Stern, Lothar Strüder, Joachim Ullrich, X. Wang, Georg Weidenspointner, Uwe Weierstall, Cornelia B. Wunderer, Henry N. Chapman

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