Short-term metal/organic interface stability investigations of organic photovoltaic devices

Matthew O. Reese, Anthony J. Morfa, Matthew S. White, Nikos Kopidakis, Sean E. Shaheen, Gary Rumbles, David S. Ginley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

As organic photovoltaic (OPV) devices have begun to move toward initial applications, issues of their stability are becoming increasingly important. The de facto standard OPV devices are made from a blend of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester (PCBM), and these serve as a test bed for lifetime testing. Delamination, oxidation, and chemical interactions at the metal electrode/organic interface have been posited as degradation pathways in organic electronic devices.[1,2] Here, two short-term experiments were employed to evaluate the stability of this interface in the light and dark. Full devices and unprotected organic surfaces were separately examined, and both were found to be stable in air over the course of 10's of minutes while in the dark. While unprotected devices were stable (less than 20% loss in efficiency) in air for 100 minutes under constant 1-sun illumination, unprotected organic surfaces were not, and good devices could not be made on them subsequently.

Original languageEnglish
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
DOIs
Publication statusPublished - 2008
Event33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States
Duration: May 11 2008May 16 2008

Other

Other33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
CountryUnited States
CitySan Diego, CA
Period5/11/085/16/08

Fingerprint

Butyric acid
Air
Metals
Delamination
Sun
Esters
Lighting
Degradation
Oxidation
Electrodes
Testing
Experiments

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Reese, M. O., Morfa, A. J., White, M. S., Kopidakis, N., Shaheen, S. E., Rumbles, G., & Ginley, D. S. (2008). Short-term metal/organic interface stability investigations of organic photovoltaic devices. In Conference Record of the IEEE Photovoltaic Specialists Conference [4922720] https://doi.org/10.1109/PVSC.2008.4922720

Short-term metal/organic interface stability investigations of organic photovoltaic devices. / Reese, Matthew O.; Morfa, Anthony J.; White, Matthew S.; Kopidakis, Nikos; Shaheen, Sean E.; Rumbles, Gary; Ginley, David S.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2008. 4922720.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Reese, MO, Morfa, AJ, White, MS, Kopidakis, N, Shaheen, SE, Rumbles, G & Ginley, DS 2008, Short-term metal/organic interface stability investigations of organic photovoltaic devices. in Conference Record of the IEEE Photovoltaic Specialists Conference., 4922720, 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008, San Diego, CA, United States, 5/11/08. https://doi.org/10.1109/PVSC.2008.4922720
Reese MO, Morfa AJ, White MS, Kopidakis N, Shaheen SE, Rumbles G et al. Short-term metal/organic interface stability investigations of organic photovoltaic devices. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2008. 4922720 https://doi.org/10.1109/PVSC.2008.4922720
Reese, Matthew O. ; Morfa, Anthony J. ; White, Matthew S. ; Kopidakis, Nikos ; Shaheen, Sean E. ; Rumbles, Gary ; Ginley, David S. / Short-term metal/organic interface stability investigations of organic photovoltaic devices. Conference Record of the IEEE Photovoltaic Specialists Conference. 2008.
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