SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING.

R. L. Cohen, Leonard C Feldman, K. W. West, P. J. Silverman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)
Original languageEnglish
Title of host publicationMat Res Soc Symp Proc
Pages357-358
Number of pages2
Volume3
Publication statusPublished - 1981

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Semiconducting silicon
iron 57
Silicides
silicides
Rutherford backscattering spectroscopy
backscattering
Spectroscopy
spectroscopy

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Cohen, R. L., Feldman, L. C., West, K. W., & Silverman, P. J. (1981). SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING. In Mat Res Soc Symp Proc (Vol. 3, pp. 357-358)

SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING. / Cohen, R. L.; Feldman, Leonard C; West, K. W.; Silverman, P. J.

Mat Res Soc Symp Proc. Vol. 3 1981. p. 357-358.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cohen, RL, Feldman, LC, West, KW & Silverman, PJ 1981, SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING. in Mat Res Soc Symp Proc. vol. 3, pp. 357-358.
Cohen RL, Feldman LC, West KW, Silverman PJ. SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING. In Mat Res Soc Symp Proc. Vol. 3. 1981. p. 357-358
Cohen, R. L. ; Feldman, Leonard C ; West, K. W. ; Silverman, P. J. / SILICIDE FORMATION AT Fe-Si INTERFACES STUDIED BY MOESSBAUER SPECTROSCOPY AND RUTHERFORD BACKSCATTERING. Mat Res Soc Symp Proc. Vol. 3 1981. pp. 357-358
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