Simulation of the scanning tunneling and atomic force microscopy images of a xanthine monolayer on graphite

D. Jung, D. K. Seo, J. Ren, M. H. Whangbo

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images of a monolayer of xanthine molecules adsorbed on graphite were simulated by calculating total and partial electron density plots for a model bilayer of xanthine and graphite. Unlike the case of the total density plots, the partial electron density plots depend strongly on the registry of xanthine molecules on the graphite lattice. This result explains why the STM images show a superstructure modulation, whereas the AFM images do not.

Original languageEnglish
Pages (from-to)476-481
Number of pages6
JournalSurface Science
Volume401
Issue number3
DOIs
Publication statusPublished - Apr 10 1998

Keywords

  • Atomic force microscopy
  • Density plot calculations
  • Image simulation
  • Scanning tunneling microscopy
  • Xanthine monolayer

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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