Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution

Olaf Schulz, Zhao Zhao, Alex Ward, Yan Liu, Hao Yan, Robert Ros

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)882-883
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
Publication statusPublished - 2012

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Confocal microscopy
Fluorescence microscopy
microscopy
fluorescence

ASJC Scopus subject areas

  • Instrumentation

Cite this

Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution. / Schulz, Olaf; Zhao, Zhao; Ward, Alex; Liu, Yan; Yan, Hao; Ros, Robert.

In: Microscopy and Microanalysis, Vol. 18, 2012, p. 882-883.

Research output: Contribution to journalArticle

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