Single grain boundary characterization of Nb-doped SrTiO3 bicrystals using ac four-point impedance spectroscopy

Jin Ha Hwang, Kevin D. Johnson, Thomas O Mason, Vinayak P. Dravid

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


AC four-point impedance spectroscopy has been applied to Nb-doped SrTiO3 bicrystals. Due to the simplified geometry and highly conductive bulk of the bicrystal, the reference impedance of the electrode was significantly reduced, validating the applicability of ac four-point impedance spectroscopy for electroceramics. DC current-voltage characteristics without any interference due to electrodes confirmed these ac measurements. Using ac four-point impedance spectroscopy, grain boundary contributions are isolated and the corresponding grain boundary thickness and resistivity are estimated.

Original languageEnglish
Pages (from-to)2621-2623
Number of pages3
JournalApplied Physics Letters
Issue number18
Publication statusPublished - May 1 2000

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Single grain boundary characterization of Nb-doped SrTiO<sub>3</sub> bicrystals using ac four-point impedance spectroscopy'. Together they form a unique fingerprint.

Cite this