Some properties of plasma-grown GaAs oxides

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)


A review of the present understanding of plasma-grown GaAs oxides is presented. In particular we discuss the results for oxides grown in a magnetically confined low temperature and low pressure oxygen plasma. From measurements (using electron, ion and photon beams) on these oxides an attempt is made to correlate the various physical properties with the electrical properties of these films. It is shown that the as-grown oxides with proper post-growth annealing treatments can have a fixed charge density of about 5 × 1011 cm-2 with a breakdown voltage of not greater than about |±106 V cm-1|. To improve the electrical properties of these oxides an overlay of thin aluminum oxide films is used to form double-layered oxides. Metal-oxide-semiconductor structures made with the double oxides show marked improvements in their electrical characteristics.

Original languageEnglish
Pages (from-to)89-106
Number of pages18
JournalThin Solid Films
Issue number1-2
Publication statusPublished - 1979

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Fingerprint Dive into the research topics of 'Some properties of plasma-grown GaAs oxides'. Together they form a unique fingerprint.

Cite this